Abstract
This paper presents the experimental observation of the degradation in asymmetric sampled grating DFB lasers by the accelerated life tests. Two degradation phenomena related to the electrical characteristics of LDs are observed during the tests. The first degradation phenomenon by increasing the reverse current is considered as a formation of leakage current path enough to prevent lasing operation in lateral blocking layer near active region of lasers. The second degradation phenomenon by decreasing the forward current is considered as activation of non-radiative Auger recombination process by thermal energy. It is also experimentally observed that the second degradation phenomenon is recovered after remained in room temperature with no electrical stress. Therefore, the criteria for LD reliability can be determined by observing the degradation of the reverse current-voltage characteristics.
| Original language | English |
|---|---|
| Pages (from-to) | 740-745 |
| Number of pages | 6 |
| Journal | Microelectronics Journal |
| Volume | 38 |
| Issue number | 6-7 |
| DOIs | |
| Publication status | Published - 2007 Jun |
Bibliographical note
Funding Information:This research was supported by the Czech Science Foundation (GA CR), project No. GA16-04420S. Access to computing and storage facilities owned by parties and projects contributing to the National Grid Infrastructure MetaCentrum, provided under the programme CESNET LM2015042, is greatly appreciated.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering