Dependence of THz metamaterial resonance on doping carrier density and pattern Line width

Y. U. Lee, E. Y. Choi, E. S. Kim, J. H. Woo, Byung Cheol Park, Jae Hoon Kim, J. W. Wu

Research output: Contribution to conferencePaper

Abstract

A series of THz metamaterials were fabricated, which have different pattern line widths of Au and different doping carrier densities of p-type silicon substrate. Transmission spectra of the metamaterials were obtained by a terahertz time domain spectroscopic measurement. Upon increasing the doping carrier density and narrowing the pattern line width, the transmission spectra showed a blue shift in resonance frequency and a broadening of resonance spectral shape, i.e., a decrease in quality factor.

Original languageEnglish
Pages505-507
Number of pages3
DOIs
Publication statusPublished - 2013
Event2013 7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2013 - Bordeaux, France
Duration: 2013 Sep 162013 Sep 19

Other

Other2013 7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2013
CountryFrance
CityBordeaux
Period13/9/1613/9/19

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials

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    Lee, Y. U., Choi, E. Y., Kim, E. S., Woo, J. H., Park, B. C., Kim, J. H., & Wu, J. W. (2013). Dependence of THz metamaterial resonance on doping carrier density and pattern Line width. 505-507. Paper presented at 2013 7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2013, Bordeaux, France. https://doi.org/10.1109/MetaMaterials.2013.6809101