Design of optimized reference signal for joint time-frequency domain reflectometry-based wiring diagnostics

Philip Crapse, Jingjiang Wang, Yong June Shin, Roger Dougal, Trang Mai, Joseph Molnar, Lan Tran

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

In order to maintain the integrity and safe operation of a power system, a state-of-the-art wiring diagnostic technique is imperative. Joint Time-Frequency Domain Reflectometry (JTFDR) is proposed as an ideal solution due to it's customizable reference signal and unique time-frequency cross-correlation function. The reference signal depends on three parameters: center frequency, bandwidth, and time duration. Previously, these parameters were chosen based on the frequency characteristics of the cable under test. This paper will fully analyze the changing effects of a wide-range of parameter combinations on two different types of defects. It is determined that there exist optimal reference signal parameters for particular defect types. With this knowledge, JTFDR is able to more sensitively detect various defect types over a longer distance than previously possible.

Original languageEnglish
Title of host publicationIEEE Autotestcon 2008 Proceedings
Pages195-201
Number of pages7
DOIs
Publication statusPublished - 2008 Dec 30
EventIEEE Autotestcon 2008 - Salt Lake City, UT, United States
Duration: 2008 Sep 82008 Sep 11

Other

OtherIEEE Autotestcon 2008
CountryUnited States
CitySalt Lake City, UT
Period08/9/808/9/11

Fingerprint

Electric wiring
Defects
Cables
Bandwidth

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Crapse, P., Wang, J., Shin, Y. J., Dougal, R., Mai, T., Molnar, J., & Tran, L. (2008). Design of optimized reference signal for joint time-frequency domain reflectometry-based wiring diagnostics. In IEEE Autotestcon 2008 Proceedings (pp. 195-201). [4662611] https://doi.org/10.1109/AUTEST.2008.4662611
Crapse, Philip ; Wang, Jingjiang ; Shin, Yong June ; Dougal, Roger ; Mai, Trang ; Molnar, Joseph ; Tran, Lan. / Design of optimized reference signal for joint time-frequency domain reflectometry-based wiring diagnostics. IEEE Autotestcon 2008 Proceedings. 2008. pp. 195-201
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abstract = "In order to maintain the integrity and safe operation of a power system, a state-of-the-art wiring diagnostic technique is imperative. Joint Time-Frequency Domain Reflectometry (JTFDR) is proposed as an ideal solution due to it's customizable reference signal and unique time-frequency cross-correlation function. The reference signal depends on three parameters: center frequency, bandwidth, and time duration. Previously, these parameters were chosen based on the frequency characteristics of the cable under test. This paper will fully analyze the changing effects of a wide-range of parameter combinations on two different types of defects. It is determined that there exist optimal reference signal parameters for particular defect types. With this knowledge, JTFDR is able to more sensitively detect various defect types over a longer distance than previously possible.",
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Crapse, P, Wang, J, Shin, YJ, Dougal, R, Mai, T, Molnar, J & Tran, L 2008, Design of optimized reference signal for joint time-frequency domain reflectometry-based wiring diagnostics. in IEEE Autotestcon 2008 Proceedings., 4662611, pp. 195-201, IEEE Autotestcon 2008, Salt Lake City, UT, United States, 08/9/8. https://doi.org/10.1109/AUTEST.2008.4662611

Design of optimized reference signal for joint time-frequency domain reflectometry-based wiring diagnostics. / Crapse, Philip; Wang, Jingjiang; Shin, Yong June; Dougal, Roger; Mai, Trang; Molnar, Joseph; Tran, Lan.

IEEE Autotestcon 2008 Proceedings. 2008. p. 195-201 4662611.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Crapse P, Wang J, Shin YJ, Dougal R, Mai T, Molnar J et al. Design of optimized reference signal for joint time-frequency domain reflectometry-based wiring diagnostics. In IEEE Autotestcon 2008 Proceedings. 2008. p. 195-201. 4662611 https://doi.org/10.1109/AUTEST.2008.4662611