Detecting inclusions in electrical impedance tomography without reference measurements

Bastian Harrach, Jin Keun Seo

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

We develop a new variant of the factorization method that can be used to detect inclusions in electrical impedance tomography from either absolute current-to-volt age measurements at a single, nonzero frequency or from frequency-difference measurements. This eliminates the need for numerically simulated reference measurements at an inclusion-free body and thus greatly improves the method's robustness against forward modeling errors, e.g., in the assumed body's shape.

Original languageEnglish
Pages (from-to)1662-1681
Number of pages20
JournalSIAM Journal on Applied Mathematics
Volume69
Issue number6
DOIs
Publication statusPublished - 2009 Jun 30

All Science Journal Classification (ASJC) codes

  • Applied Mathematics

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