Detecting inclusions in electrical impedance tomography without reference measurements

Bastian Harrach, Jin Keun Seo

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

We develop a new variant of the factorization method that can be used to detect inclusions in electrical impedance tomography from either absolute current-to-volt age measurements at a single, nonzero frequency or from frequency-difference measurements. This eliminates the need for numerically simulated reference measurements at an inclusion-free body and thus greatly improves the method's robustness against forward modeling errors, e.g., in the assumed body's shape.

Original languageEnglish
Pages (from-to)1662-1681
Number of pages20
JournalSIAM Journal on Applied Mathematics
Volume69
Issue number6
DOIs
Publication statusPublished - 2009 Jun 30

Fingerprint

Electrical Impedance Tomography
Acoustic impedance
Tomography
Inclusion
Factorization Method
Modeling Error
Factorization
Eliminate
Robustness

All Science Journal Classification (ASJC) codes

  • Applied Mathematics

Cite this

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Detecting inclusions in electrical impedance tomography without reference measurements. / Harrach, Bastian; Seo, Jin Keun.

In: SIAM Journal on Applied Mathematics, Vol. 69, No. 6, 30.06.2009, p. 1662-1681.

Research output: Contribution to journalArticle

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