Development of a new image based BRDF measurement system using a semicircular ring

Seul Ki Yang, In Ung Song, Eunsong Oh, Ho Soon Yang, Sug Whan Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We developed a new measurement system for bidirectional reflectance distribution functions (BRDF). The system can obtain simultaneously isotropic BRDF of all scattering angles utilizing a semicircular ring and an image sensor. First, we predicted the performance of our measurement system using integrated ray tracing simulation. The light path is as follows: the light from the light source at 635 nm is reflected off the target material, and the light is reflected back at the semi-circular ring. The image sensor records the light reflected from the semicircular ring. The results show good agreement with original and simulation BRDF, but detailed analysis suggested. The system improves significantly measurement time and resolution of reflection angles. Furthermore, the system is not only more cost effective than other traditional measurement systems, but also eliminated the temporal fluctuation of the light source intensity.

Original languageEnglish
Title of host publicationReflection, Scattering, and Diffraction from Surfaces VII
EditorsLeonard M. Hanssen
PublisherSPIE
ISBN (Electronic)9781510637764
DOIs
Publication statusPublished - 2020
EventReflection, Scattering, and Diffraction from Surfaces VII 2020 - Virtual, Online, United States
Duration: 2020 Aug 242020 Sept 4

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11485
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceReflection, Scattering, and Diffraction from Surfaces VII 2020
Country/TerritoryUnited States
CityVirtual, Online
Period20/8/2420/9/4

Bibliographical note

Publisher Copyright:
© 2020 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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