Abstract
We developed a new measurement system for bidirectional reflectance distribution functions (BRDF). The system can obtain simultaneously isotropic BRDF of all scattering angles utilizing a semicircular ring and an image sensor. First, we predicted the performance of our measurement system using integrated ray tracing simulation. The light path is as follows: the light from the light source at 635 nm is reflected off the target material, and the light is reflected back at the semi-circular ring. The image sensor records the light reflected from the semicircular ring. The results show good agreement with original and simulation BRDF, but detailed analysis suggested. The system improves significantly measurement time and resolution of reflection angles. Furthermore, the system is not only more cost effective than other traditional measurement systems, but also eliminated the temporal fluctuation of the light source intensity.
Original language | English |
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Title of host publication | Reflection, Scattering, and Diffraction from Surfaces VII |
Editors | Leonard M. Hanssen |
Publisher | SPIE |
ISBN (Electronic) | 9781510637764 |
DOIs | |
Publication status | Published - 2020 |
Event | Reflection, Scattering, and Diffraction from Surfaces VII 2020 - Virtual, Online, United States Duration: 2020 Aug 24 → 2020 Sept 4 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 11485 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Reflection, Scattering, and Diffraction from Surfaces VII 2020 |
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Country/Territory | United States |
City | Virtual, Online |
Period | 20/8/24 → 20/9/4 |
Bibliographical note
Publisher Copyright:© 2020 SPIE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering