For applying near-field recording (NFR) technology to optical storage devices for the next generation, it is positively necessary to maintain a small air gap under about 100 nm. We design an apparatus to measure the air gap between the CISD type SIL  and the interface of dielectric substrate of the disk. And it consists of a prism, a polarizer and an analyzer. The air gap including the far-field as well as the near-field range is determined by measuring the intensity of polarized reflectance light. Through the Fresnel equation and Jones matrices, a mathematical model is established to understand the characteristics of a system according to design parameters. We can change measurement ranges/resolutions by adjusting an incident angle into the air interface. Experimental results for some specific cases are in good agreement with simulated ones and demonstrate the possibility as a new optical gap detector.
|Number of pages||6|
|Publication status||Published - 2003 Dec|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Hardware and Architecture
- Electrical and Electronic Engineering