Abstract
Diamond-like carbon (DLC) layer was deposited by the Cs+ ion sputtered negative ion deposition technique between hole transport layer and indium tin oxide (ITO) anode for polymeric electroluminescent device. An acidic poly(styrene sulfonate)-doped poly(3,4-ethylene dioxythiophene):poly- (styrenesulphonic acid) (PEDOT:PSS) solution acting as a hole transporting material etches the ITO surface and the PEDOT:PSS/ITO interface is not stable. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry have been used to measure the indium contamination in the organic layers such as PEDOT:PSS and poly[2-methoxy-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene]. From the result, it was found that the DLC buffer layer protects ITO surface from acidic PEDOT:PSS solution and restrains the indium diffusion into organic layer. The device with the DLC layer also has electroluminescent efficiency by almost 2 times in the polymeric electroluminescent device compared with the device without diamond-like carbon layer.
Original language | English |
---|---|
Pages (from-to) | 351-357 |
Number of pages | 7 |
Journal | Thin Solid Films |
Volume | 483 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 2005 Jul 1 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry