Different contact formations at the interfaces of C 60/LiF/Al and C 60/LiF/Ag

Pyungeun Jeon, Seong Jun Kang, Hyunbok Lee, Jeihyun Lee, Kwangho Jeong, Jinwoo Lee, Yeonjin Yi

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3 Citations (Scopus)

Abstract

C 60 has been used as an electron accepting and transporting material in various organic electronic devices. In such devices, Al and Ag have been adopted as a common cathode in combination with electron injection layers (EIL), e.g., LiF. We found that the initial interface formations of C 60/LiF/Al and C 60/LiF/Ag are quite different in terms of interfacial electronic structures. We measured the interfacial electronic structures with photoemission spectroscopy and found that LiF works well as an EIL on Al but performs poorly on Ag. The origin of this difference could be attributed to the larger interface dipole on Al, highlighting the importance of the choice of cathode materials.

Original languageEnglish
Article number073711
JournalJournal of Applied Physics
Volume111
Issue number7
DOIs
Publication statusPublished - 2012 Apr 1

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cathodes
injection
electronic structure
electrons
photoelectric emission
dipoles
electronics
spectroscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Jeon, Pyungeun ; Kang, Seong Jun ; Lee, Hyunbok ; Lee, Jeihyun ; Jeong, Kwangho ; Lee, Jinwoo ; Yi, Yeonjin. / Different contact formations at the interfaces of C 60/LiF/Al and C 60/LiF/Ag. In: Journal of Applied Physics. 2012 ; Vol. 111, No. 7.
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Different contact formations at the interfaces of C 60/LiF/Al and C 60/LiF/Ag. / Jeon, Pyungeun; Kang, Seong Jun; Lee, Hyunbok; Lee, Jeihyun; Jeong, Kwangho; Lee, Jinwoo; Yi, Yeonjin.

In: Journal of Applied Physics, Vol. 111, No. 7, 073711, 01.04.2012.

Research output: Contribution to journalArticle

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AU - Jeon, Pyungeun

AU - Kang, Seong Jun

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AU - Jeong, Kwangho

AU - Lee, Jinwoo

AU - Yi, Yeonjin

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