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Dive into the research topics of 'Direct electrical characteristics of GaN nanowire Field Effect Transistor (FET) without assistance of E-beam Lithography (EBL)'. Together they form a unique fingerprint.- Sort by
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Sang Kwon Lee, Han Kyu Seong, Ki Chul Choi, Nam Kyu Cho, Heon Jin Choi, Eun Kyung Suh, Kee Suk Nahm
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution