Direct quantum process tomography via measuring sequential weak values

Yosep Kim, Yong Su Kim, Sang Yun Lee, Sang Wook Han, Sung Moon, Yoon Ho Kim, Young Wook Cho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
Publication statusPublished - 2018 Aug 6
Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Publication series

Name2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Other

Other2018 Conference on Lasers and Electro-Optics, CLEO 2018
CountryUnited States
CitySan Jose
Period18/5/1318/5/18

Bibliographical note

Publisher Copyright:
© 2018 OSA.

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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