Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels

Seyoung Park, Jaeyeon Jang, Chang Ouk Kim

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels'. Together they form a unique fingerprint.

Engineering & Materials Science