Displays, sensors, and MEMS - MEMS and NEMS

Euisik Yoon, Hagen Klauk

Research output: Contribution to journalEditorial

Original languageEnglish
Article number4154244
JournalTechnical Digest - International Electron Devices Meeting, IEDM
DOIs
Publication statusPublished - 2006 Dec 1
Event2006 International Electron Devices Meeting, IEDM - San Francisco, CA, United States
Duration: 2006 Dec 102006 Dec 13

Fingerprint

NEMS
microelectromechanical systems
MEMS
Display devices
sensors
Sensors

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

@article{3d0b797c6c6e4e8fa72e068c33d8169d,
title = "Displays, sensors, and MEMS - MEMS and NEMS",
author = "Euisik Yoon and Hagen Klauk",
year = "2006",
month = "12",
day = "1",
doi = "10.1109/IEDM.2006.346825",
language = "English",
journal = "Technical Digest - International Electron Devices Meeting",
issn = "0163-1918",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

Displays, sensors, and MEMS - MEMS and NEMS. / Yoon, Euisik; Klauk, Hagen.

In: Technical Digest - International Electron Devices Meeting, IEDM, 01.12.2006.

Research output: Contribution to journalEditorial

TY - JOUR

T1 - Displays, sensors, and MEMS - MEMS and NEMS

AU - Yoon, Euisik

AU - Klauk, Hagen

PY - 2006/12/1

Y1 - 2006/12/1

UR - http://www.scopus.com/inward/record.url?scp=46049117354&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=46049117354&partnerID=8YFLogxK

U2 - 10.1109/IEDM.2006.346825

DO - 10.1109/IEDM.2006.346825

M3 - Editorial

AN - SCOPUS:46049117354

JO - Technical Digest - International Electron Devices Meeting

JF - Technical Digest - International Electron Devices Meeting

SN - 0163-1918

M1 - 4154244

ER -