DPSC SRAM transparent test algorithm

Hong Sik Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.

Original languageEnglish
Title of host publicationProceedings of the 11th Asian Test Symposium, ATS 2002
PublisherIEEE Computer Society
Pages145-150
Number of pages6
Volume2002-January
ISBN (Electronic)0769518257, 0769518257
DOIs
Publication statusPublished - 2002 Jan 1
Event11th Asian Test Symposium, ATS 2002 - Guam, United States
Duration: 2002 Nov 182002 Nov 20

Other

Other11th Asian Test Symposium, ATS 2002
CountryUnited States
CityGuam
Period02/11/1802/11/20

Fingerprint

Static random access storage
Hardware

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Kim, H. S., & Kang, S. (2002). DPSC SRAM transparent test algorithm. In Proceedings of the 11th Asian Test Symposium, ATS 2002 (Vol. 2002-January, pp. 145-150). [1181702] IEEE Computer Society. https://doi.org/10.1109/ATS.2002.1181702
Kim, Hong Sik ; Kang, Sungho. / DPSC SRAM transparent test algorithm. Proceedings of the 11th Asian Test Symposium, ATS 2002. Vol. 2002-January IEEE Computer Society, 2002. pp. 145-150
@inproceedings{79d9adcba4e64c4cbc2641d10814c74a,
title = "DPSC SRAM transparent test algorithm",
abstract = "We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.",
author = "Kim, {Hong Sik} and Sungho Kang",
year = "2002",
month = "1",
day = "1",
doi = "10.1109/ATS.2002.1181702",
language = "English",
volume = "2002-January",
pages = "145--150",
booktitle = "Proceedings of the 11th Asian Test Symposium, ATS 2002",
publisher = "IEEE Computer Society",
address = "United States",

}

Kim, HS & Kang, S 2002, DPSC SRAM transparent test algorithm. in Proceedings of the 11th Asian Test Symposium, ATS 2002. vol. 2002-January, 1181702, IEEE Computer Society, pp. 145-150, 11th Asian Test Symposium, ATS 2002, Guam, United States, 02/11/18. https://doi.org/10.1109/ATS.2002.1181702

DPSC SRAM transparent test algorithm. / Kim, Hong Sik; Kang, Sungho.

Proceedings of the 11th Asian Test Symposium, ATS 2002. Vol. 2002-January IEEE Computer Society, 2002. p. 145-150 1181702.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - DPSC SRAM transparent test algorithm

AU - Kim, Hong Sik

AU - Kang, Sungho

PY - 2002/1/1

Y1 - 2002/1/1

N2 - We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.

AB - We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.

UR - http://www.scopus.com/inward/record.url?scp=33646946646&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33646946646&partnerID=8YFLogxK

U2 - 10.1109/ATS.2002.1181702

DO - 10.1109/ATS.2002.1181702

M3 - Conference contribution

VL - 2002-January

SP - 145

EP - 150

BT - Proceedings of the 11th Asian Test Symposium, ATS 2002

PB - IEEE Computer Society

ER -

Kim HS, Kang S. DPSC SRAM transparent test algorithm. In Proceedings of the 11th Asian Test Symposium, ATS 2002. Vol. 2002-January. IEEE Computer Society. 2002. p. 145-150. 1181702 https://doi.org/10.1109/ATS.2002.1181702