DPSC SRAM transparent test algorithm

Hong Sik Kim; Sungho Kang

doi:10.1109/ATS.2002.1181702

DPSC SRAM transparent test algorithm

Hong Sik Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.

Original language	English
Title of host publication	Proceedings of the 11th Asian Test Symposium, ATS 2002
Publisher	IEEE Computer Society
Pages	145-150
Number of pages	6
ISBN (Electronic)	0769518257, 0769518257
DOIs	https://doi.org/10.1109/ATS.2002.1181702
Publication status	Published - 2002
Event	11th Asian Test Symposium, ATS 2002 - Guam, United States Duration: 2002 Nov 18 → 2002 Nov 20

Publication series

Name	Proceedings of the Asian Test Symposium
Volume	2002-January
ISSN (Print)	1081-7735

Other

Other	11th Asian Test Symposium, ATS 2002
Country/Territory	United States
City	Guam
Period	02/11/18 → 02/11/20

Bibliographical note

Publisher Copyright:
© 2002 IEEE.

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/ATS.2002.1181702

Cite this

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title = "DPSC SRAM transparent test algorithm",

abstract = "We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.",

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AB - We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.

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M3 - Conference contribution

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ER -

DPSC SRAM transparent test algorithm

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