We present a new transparent SRAM test algorithm, which uses dynamic power supply current. The proposed test scheme employs the dynamic power supply current instead of making signatures, so that it does not need the additional steps and additional hardware to generate signatures. This paper describes how to convert a traditional March algorithm to a transparent one. The transformed algorithm is much simpler and the test time can be reduced very much. In addition, it can detect some additional faults that the original algorithm cannot detect.
|Title of host publication||Proceedings of the 11th Asian Test Symposium, ATS 2002|
|Publisher||IEEE Computer Society|
|Number of pages||6|
|ISBN (Electronic)||0769518257, 0769518257|
|Publication status||Published - 2002|
|Event||11th Asian Test Symposium, ATS 2002 - Guam, United States|
Duration: 2002 Nov 18 → 2002 Nov 20
|Name||Proceedings of the Asian Test Symposium|
|Other||11th Asian Test Symposium, ATS 2002|
|Period||02/11/18 → 02/11/20|
Bibliographical notePublisher Copyright:
© 2002 IEEE.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering