Dual-energy approach to reduce cone-beam artefacts in a circular orbit cone-beam CT system

C. Han, J. Baek

Research output: Contribution to journalArticlepeer-review


The authors propose a dual-energy approach to reduce cone-beam artefacts in a circular orbit cone-beam computed tomography (CT) system. When there exist multiple dense structures within a large cone angle, two-pass algorithm is ineffective for reducing cone-beam artefacts because high-density materials are incorrectly segmented with simple thresholding. The proposed algorithm utilises projection data obtained with dual-energy X-ray spectra to estimate projections of the high-density materials from multi-density anatomical structures. Using bone and water as two of basis functions, the projection data of bone materials can be precisely estimated via dual-energy scans. Then, bone-only images are reconstructed by a constrained total-variation minimisation-based iterative algorithm. The reconstructed bone images are used to generate cone-beam artefacts and the final corrected images are acquired by subtracting the generated cone-beam artefacts from the original Feldkamp, Davis, and Kress images. The proposed method was validated using an extended cardiac-torso phantom with complex vertebral anatomy and compared with the two-pass algorithm. The results show that the proposed method restores distorted bony structures and intensity values, especially in regions with large cone angles. A qualitative evaluation of the mean-squared errors and structural similarities demonstrates the effectiveness of the proposed method compared to the two-pass algorithm.

Original languageEnglish
Pages (from-to)648-650
Number of pages3
JournalElectronics Letters
Issue number13
Publication statusPublished - 2020 Jun 25

Bibliographical note

Funding Information:
Acknowledgments: This research was supported by the National Research Foundation of Korea (NRF) grant funded by the Ministry of Science and ICT (grant nos. NRF-2019R1A2C2084936 and NRF-2018M3A9H6081483).

Publisher Copyright:
© The Institution of Engineering and Technology 2020

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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