Dual-wavelength diffraction phase microscopy for real-time dispersion measurement

Mohammad Reza Jafarfard; Behnam Tayebi; Dug Young Kim

doi:10.1117/12.2061225

Dual-wavelength diffraction phase microscopy for real-time dispersion measurement

Mohammad Reza Jafarfard, Behnam Tayebi, Dug Young Kim

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Citations (Scopus)

Abstract

We present a dual-wavelength diffraction phase microscopy (DW-DPM) that obtains the wavelength-differentiated dual phase images in a single shot of interference fringe acquisition. For this, the diffraction phase microscopy (DPM) system was constructed with a transmission grating and a spatial filter that form a common-path interferometer. With a light source of two spectral components, a different diffraction order of the grating was utilized for each. This resulted in a combined but distinguishable interference pattern to be acquired by a single image sensor. In this research, our dualwavelength phase imaging scheme was applied to simultaneously measure dispersion of a sample. Stable and reliable measurements could be performed in a single shot due to the robust structure of our DW-DPM system.

Original language	English
Title of host publication	Interferometry XVII
Subtitle of host publication	Techniques and Analysis
Editors	Katherine Creath, Jan Burke, Joanna Schmit
Publisher	SPIE
ISBN (Electronic)	9781628412307
DOIs	https://doi.org/10.1117/12.2061225
Publication status	Published - 2014
Event	Interferometry XVII: Techniques and Analysis - San Diego, United States Duration: 2014 Aug 17 → 2014 Aug 19

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9203
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Interferometry XVII: Techniques and Analysis
Country/Territory	United States
City	San Diego
Period	14/8/17 → 14/8/19

Bibliographical note

Publisher Copyright:
© 2014 SPIE.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.2061225

Cite this

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title = "Dual-wavelength diffraction phase microscopy for real-time dispersion measurement",

abstract = "We present a dual-wavelength diffraction phase microscopy (DW-DPM) that obtains the wavelength-differentiated dual phase images in a single shot of interference fringe acquisition. For this, the diffraction phase microscopy (DPM) system was constructed with a transmission grating and a spatial filter that form a common-path interferometer. With a light source of two spectral components, a different diffraction order of the grating was utilized for each. This resulted in a combined but distinguishable interference pattern to be acquired by a single image sensor. In this research, our dualwavelength phase imaging scheme was applied to simultaneously measure dispersion of a sample. Stable and reliable measurements could be performed in a single shot due to the robust structure of our DW-DPM system.",

author = "Jafarfard, {Mohammad Reza} and Behnam Tayebi and Kim, {Dug Young}",

note = "Publisher Copyright: {\textcopyright} 2014 SPIE.; Interferometry XVII: Techniques and Analysis ; Conference date: 17-08-2014 Through 19-08-2014",

year = "2014",

doi = "10.1117/12.2061225",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

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Jafarfard, MR, Tayebi, B & Kim, DY 2014, Dual-wavelength diffraction phase microscopy for real-time dispersion measurement. in K Creath, J Burke & J Schmit (eds), Interferometry XVII: Techniques and Analysis., 92030T-1, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9203, SPIE, Interferometry XVII: Techniques and Analysis, San Diego, United States, 14/8/17. https://doi.org/10.1117/12.2061225

Dual-wavelength diffraction phase microscopy for real-time dispersion measurement. / Jafarfard, Mohammad Reza; Tayebi, Behnam; Kim, Dug Young.

Interferometry XVII: Techniques and Analysis. ed. / Katherine Creath; Jan Burke; Joanna Schmit. SPIE, 2014. 92030T-1 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9203).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - We present a dual-wavelength diffraction phase microscopy (DW-DPM) that obtains the wavelength-differentiated dual phase images in a single shot of interference fringe acquisition. For this, the diffraction phase microscopy (DPM) system was constructed with a transmission grating and a spatial filter that form a common-path interferometer. With a light source of two spectral components, a different diffraction order of the grating was utilized for each. This resulted in a combined but distinguishable interference pattern to be acquired by a single image sensor. In this research, our dualwavelength phase imaging scheme was applied to simultaneously measure dispersion of a sample. Stable and reliable measurements could be performed in a single shot due to the robust structure of our DW-DPM system.

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Dual-wavelength diffraction phase microscopy for real-time dispersion measurement

Abstract

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Bibliographical note

All Science Journal Classification (ASJC) codes

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