Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness

Mohammad Reza Jafarfard, Sucbei Moon, Behnam Tayebi, Dug Young Kim

Research output: Contribution to journalArticle

54 Citations (Scopus)

Abstract

We present a quantitative phase microscopy scheme that simultaneously acquires two phase images at different wavelengths. The simultaneous dual-wavelength measurement was performed with a diffraction phase microscope (DPM) based on a transmission grating and a spatial filter that form a common-path imaging interferometer. With a combined laser source that generates two-color light continuously, a different diffraction order of the grating was utilized for each wavelength component so that the dual-wavelength interference pattern could be distinguished by the distinct fringe frequencies. Our dual-wavelength phase imaging allowed us to extract information on the physical thickness and the refractive index for a specimen immersed in a highly dispersive surrounding medium. We found that our dual-wavelength DPM (DW-DPM) provides an accurate measurement of the volume and the refractive index of a microscopy sample with good measurement stability that results from the common-path geometry.

Original languageEnglish
Pages (from-to)2908-2911
Number of pages4
JournalOptics Letters
Volume39
Issue number10
DOIs
Publication statusPublished - 2014 May 15

Fingerprint

refractivity
microscopy
diffraction
wavelengths
microscopes
gratings
interferometers
interference
color
filters
geometry
lasers

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Jafarfard, Mohammad Reza ; Moon, Sucbei ; Tayebi, Behnam ; Kim, Dug Young. / Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness. In: Optics Letters. 2014 ; Vol. 39, No. 10. pp. 2908-2911.
@article{e23237e7cb1e4384928b3d55b5150802,
title = "Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness",
abstract = "We present a quantitative phase microscopy scheme that simultaneously acquires two phase images at different wavelengths. The simultaneous dual-wavelength measurement was performed with a diffraction phase microscope (DPM) based on a transmission grating and a spatial filter that form a common-path imaging interferometer. With a combined laser source that generates two-color light continuously, a different diffraction order of the grating was utilized for each wavelength component so that the dual-wavelength interference pattern could be distinguished by the distinct fringe frequencies. Our dual-wavelength phase imaging allowed us to extract information on the physical thickness and the refractive index for a specimen immersed in a highly dispersive surrounding medium. We found that our dual-wavelength DPM (DW-DPM) provides an accurate measurement of the volume and the refractive index of a microscopy sample with good measurement stability that results from the common-path geometry.",
author = "Jafarfard, {Mohammad Reza} and Sucbei Moon and Behnam Tayebi and Kim, {Dug Young}",
year = "2014",
month = "5",
day = "15",
doi = "10.1364/OL.39.002908",
language = "English",
volume = "39",
pages = "2908--2911",
journal = "Optics Letters",
issn = "0146-9592",
publisher = "The Optical Society",
number = "10",

}

Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness. / Jafarfard, Mohammad Reza; Moon, Sucbei; Tayebi, Behnam; Kim, Dug Young.

In: Optics Letters, Vol. 39, No. 10, 15.05.2014, p. 2908-2911.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness

AU - Jafarfard, Mohammad Reza

AU - Moon, Sucbei

AU - Tayebi, Behnam

AU - Kim, Dug Young

PY - 2014/5/15

Y1 - 2014/5/15

N2 - We present a quantitative phase microscopy scheme that simultaneously acquires two phase images at different wavelengths. The simultaneous dual-wavelength measurement was performed with a diffraction phase microscope (DPM) based on a transmission grating and a spatial filter that form a common-path imaging interferometer. With a combined laser source that generates two-color light continuously, a different diffraction order of the grating was utilized for each wavelength component so that the dual-wavelength interference pattern could be distinguished by the distinct fringe frequencies. Our dual-wavelength phase imaging allowed us to extract information on the physical thickness and the refractive index for a specimen immersed in a highly dispersive surrounding medium. We found that our dual-wavelength DPM (DW-DPM) provides an accurate measurement of the volume and the refractive index of a microscopy sample with good measurement stability that results from the common-path geometry.

AB - We present a quantitative phase microscopy scheme that simultaneously acquires two phase images at different wavelengths. The simultaneous dual-wavelength measurement was performed with a diffraction phase microscope (DPM) based on a transmission grating and a spatial filter that form a common-path imaging interferometer. With a combined laser source that generates two-color light continuously, a different diffraction order of the grating was utilized for each wavelength component so that the dual-wavelength interference pattern could be distinguished by the distinct fringe frequencies. Our dual-wavelength phase imaging allowed us to extract information on the physical thickness and the refractive index for a specimen immersed in a highly dispersive surrounding medium. We found that our dual-wavelength DPM (DW-DPM) provides an accurate measurement of the volume and the refractive index of a microscopy sample with good measurement stability that results from the common-path geometry.

UR - http://www.scopus.com/inward/record.url?scp=84901022849&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84901022849&partnerID=8YFLogxK

U2 - 10.1364/OL.39.002908

DO - 10.1364/OL.39.002908

M3 - Article

VL - 39

SP - 2908

EP - 2911

JO - Optics Letters

JF - Optics Letters

SN - 0146-9592

IS - 10

ER -