Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness

Mohammad Reza Jafarfard, Sucbei Moon, Behnam Tayebi, Dug Young Kim

Research output: Contribution to journalArticle

59 Citations (Scopus)

Abstract

We present a quantitative phase microscopy scheme that simultaneously acquires two phase images at different wavelengths. The simultaneous dual-wavelength measurement was performed with a diffraction phase microscope (DPM) based on a transmission grating and a spatial filter that form a common-path imaging interferometer. With a combined laser source that generates two-color light continuously, a different diffraction order of the grating was utilized for each wavelength component so that the dual-wavelength interference pattern could be distinguished by the distinct fringe frequencies. Our dual-wavelength phase imaging allowed us to extract information on the physical thickness and the refractive index for a specimen immersed in a highly dispersive surrounding medium. We found that our dual-wavelength DPM (DW-DPM) provides an accurate measurement of the volume and the refractive index of a microscopy sample with good measurement stability that results from the common-path geometry.

Original languageEnglish
Pages (from-to)2908-2911
Number of pages4
JournalOptics Letters
Volume39
Issue number10
DOIs
Publication statusPublished - 2014 May 15

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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