Dynamic trace signal selection for post-silicon validation

Kihyuk Han, Joon Sung Yang, Jacob A. Abraham

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

In order to gain market share in today's competitive high-tech industry, fast time-to-market (TTM) is one of the key factors for the success of a product. Since pre-silicon verification cannot be applied exhaustively as the size and complexity of the integrated circuit design increases, post-silicon validation becomes crucial to capture bugs and design errors that escape from the pre-silicon verification phase. However, because of the limited observability of internal states due to the limited storage capacity available for post-silicon validation, selecting optimal sets of trace signals has always been a challenging task for debugging engineers. This paper proposes a new dynamic trace signal selection algorithm to maximize the restoration ratio for internal circuit states. Experimental results on benchmark circuits and an industry design show that the proposed technique provides a high degree of state restoration regardless of the input test patterns.

Original languageEnglish
Title of host publicationProceedings - 26th International Conference on VLSI Design, VLSID 2013 - Concurrently with 12th International Conference on Embedded Systems Design, ES 2013
Pages302-307
Number of pages6
DOIs
Publication statusPublished - 2013
Event2013 26th International Conference on VLSI Design, VLSID 2013 and 12th International Conference on Embedded Systems, ES 2013 - Pune, India
Duration: 2013 Jan 52013 Jan 10

Publication series

NameProceedings of the IEEE International Conference on VLSI Design
ISSN (Print)1063-9667

Conference

Conference2013 26th International Conference on VLSI Design, VLSID 2013 and 12th International Conference on Embedded Systems, ES 2013
CountryIndia
CityPune
Period13/1/513/1/10

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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