Edge-adaptive demosaicking for artifact suppression along line edges

Jonghwa Lee, Taeuk Jeong, Chulhee Lee

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

In this paper, we present an edge-adaptive demosaicking method for artifact suppression along line edges. Although various demosaicking methods have been proposed, they still suffer from artifacts along line edges. In order to suppress these undesirable artifacts, the proposed method first determines the pattern of line edges and interpolates missing pixels along the detected direction during initial interpolation. Then, refinement and calibration processes are carried out in series to improve image quality. Experimental results demonstrate that the proposed method produces visually pleasing images and outperforms existing demosaicking methods in terms of the peak signal-to-noise ratio (PSNR) and the mean squared error of S-CIELAB.

Original languageEnglish
Pages (from-to)1076-1083
Number of pages8
JournalIEEE Transactions on Consumer Electronics
Volume53
Issue number3
DOIs
Publication statusPublished - 2007 Aug 1

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Image quality
Signal to noise ratio
Interpolation
Pixels
Calibration

All Science Journal Classification (ASJC) codes

  • Media Technology
  • Electrical and Electronic Engineering

Cite this

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Edge-adaptive demosaicking for artifact suppression along line edges. / Lee, Jonghwa; Jeong, Taeuk; Lee, Chulhee.

In: IEEE Transactions on Consumer Electronics, Vol. 53, No. 3, 01.08.2007, p. 1076-1083.

Research output: Contribution to journalArticle

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