Edge effects in buckled thin films on elastomeric substrates

C. T. Koh, Z. J. Liu, D. Y. Khang, J. Song, C. Lu, Y. Huang, J. A. Rogers, C. G. Koh

Research output: Contribution to journalArticlepeer-review

33 Citations (Scopus)

Abstract

Buckled thin films on elastomeric substrates have many applications. Films of this type exhibit periodic, sinusoidal "wavy" relief profiles, except near edges that lie perpendicular to the wavevector associated with waves. In these locations, the amplitudes of the waves steadily decrease until the films become completely flat, in a manner that can be used to advantage in applications. This paper quantitatively describes the mechanics of this phenomenon. The finite element analysis shows that the edge effect results from the traction-free boundary condition. The edge-effect length is proportional to the thin-film thickness, and decreases with the increasing prestrain and substrate modulus.

Original languageEnglish
Article number133113
JournalApplied Physics Letters
Volume91
Issue number13
DOIs
Publication statusPublished - 2007

Bibliographical note

Funding Information:
The authors acknowledge the support from Institute of High Performance Computing in Singapore, the National Science Foundation (DMI-0328162), and the U.S. Department of Energy, Division of Materials Sciences (DEFG02-91ER45439).

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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