Edge tool influence function library using the parametric edge model for computer controlled optical surfacing

Dae Wook Kim, Won Hyun Park, Sug-Whan Kim, James H. Burge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Abstract

Computer controlled optical surfacing (CCOS) requires accurate knowledge of the tool influence function (TIF) for the polishing tool. The linear Preston's model for material removal has been used to determine the TIF for most cases. As the tool runs over the edge of the workpiece, however, nonlinear removal behavior needs to be considered to model the edge TIF. We reported a new parametric edge TIF model in a previous paper.* This model fits 5 parameters to measured data to accurately predict the edge TIF. We present material from the previous paper, and provide a library of the parametric edge TIFs for various tool shape and motion cases. The edge TIF library is a useful reference to design an edge figuring process using a CCOS technique.

Original languageEnglish
Title of host publicationOptical Manufacturing and Testing VIII
Volume7426
DOIs
Publication statusPublished - 2009 Oct 19
EventOptical Manufacturing and Testing VIII - San Diego, CA, United States
Duration: 2009 Aug 42009 Aug 5

Other

OtherOptical Manufacturing and Testing VIII
CountryUnited States
CitySan Diego, CA
Period09/8/409/8/5

Fingerprint

Influence Function
Hard facing
Model
Libraries
Polishing
polishing
machining
Linear Model
Predict
Motion

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Kim, D. W., Park, W. H., Kim, S-W., & Burge, J. H. (2009). Edge tool influence function library using the parametric edge model for computer controlled optical surfacing. In Optical Manufacturing and Testing VIII (Vol. 7426). [74260G] https://doi.org/10.1117/12.828499
Kim, Dae Wook ; Park, Won Hyun ; Kim, Sug-Whan ; Burge, James H. / Edge tool influence function library using the parametric edge model for computer controlled optical surfacing. Optical Manufacturing and Testing VIII. Vol. 7426 2009.
@inproceedings{4313b996d18d4909973e0c5a243f0b8e,
title = "Edge tool influence function library using the parametric edge model for computer controlled optical surfacing",
abstract = "Computer controlled optical surfacing (CCOS) requires accurate knowledge of the tool influence function (TIF) for the polishing tool. The linear Preston's model for material removal has been used to determine the TIF for most cases. As the tool runs over the edge of the workpiece, however, nonlinear removal behavior needs to be considered to model the edge TIF. We reported a new parametric edge TIF model in a previous paper.* This model fits 5 parameters to measured data to accurately predict the edge TIF. We present material from the previous paper, and provide a library of the parametric edge TIFs for various tool shape and motion cases. The edge TIF library is a useful reference to design an edge figuring process using a CCOS technique.",
author = "Kim, {Dae Wook} and Park, {Won Hyun} and Sug-Whan Kim and Burge, {James H.}",
year = "2009",
month = "10",
day = "19",
doi = "10.1117/12.828499",
language = "English",
isbn = "9780819477163",
volume = "7426",
booktitle = "Optical Manufacturing and Testing VIII",

}

Kim, DW, Park, WH, Kim, S-W & Burge, JH 2009, Edge tool influence function library using the parametric edge model for computer controlled optical surfacing. in Optical Manufacturing and Testing VIII. vol. 7426, 74260G, Optical Manufacturing and Testing VIII, San Diego, CA, United States, 09/8/4. https://doi.org/10.1117/12.828499

Edge tool influence function library using the parametric edge model for computer controlled optical surfacing. / Kim, Dae Wook; Park, Won Hyun; Kim, Sug-Whan; Burge, James H.

Optical Manufacturing and Testing VIII. Vol. 7426 2009. 74260G.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Edge tool influence function library using the parametric edge model for computer controlled optical surfacing

AU - Kim, Dae Wook

AU - Park, Won Hyun

AU - Kim, Sug-Whan

AU - Burge, James H.

PY - 2009/10/19

Y1 - 2009/10/19

N2 - Computer controlled optical surfacing (CCOS) requires accurate knowledge of the tool influence function (TIF) for the polishing tool. The linear Preston's model for material removal has been used to determine the TIF for most cases. As the tool runs over the edge of the workpiece, however, nonlinear removal behavior needs to be considered to model the edge TIF. We reported a new parametric edge TIF model in a previous paper.* This model fits 5 parameters to measured data to accurately predict the edge TIF. We present material from the previous paper, and provide a library of the parametric edge TIFs for various tool shape and motion cases. The edge TIF library is a useful reference to design an edge figuring process using a CCOS technique.

AB - Computer controlled optical surfacing (CCOS) requires accurate knowledge of the tool influence function (TIF) for the polishing tool. The linear Preston's model for material removal has been used to determine the TIF for most cases. As the tool runs over the edge of the workpiece, however, nonlinear removal behavior needs to be considered to model the edge TIF. We reported a new parametric edge TIF model in a previous paper.* This model fits 5 parameters to measured data to accurately predict the edge TIF. We present material from the previous paper, and provide a library of the parametric edge TIFs for various tool shape and motion cases. The edge TIF library is a useful reference to design an edge figuring process using a CCOS technique.

UR - http://www.scopus.com/inward/record.url?scp=70349917536&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=70349917536&partnerID=8YFLogxK

U2 - 10.1117/12.828499

DO - 10.1117/12.828499

M3 - Conference contribution

AN - SCOPUS:70349917536

SN - 9780819477163

VL - 7426

BT - Optical Manufacturing and Testing VIII

ER -