EDI-based deinterlacing using edge patterns

Min Byun, Min Kyu Park, Moon Gi Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

In this paper, a new EDI-based deinterlacing algorithm is proposed. Generally, EDI algorithms perform visually better than any other intrafield deinterlacing algorithm. However, they produce unpleasant results due to their failure in estimating edge direction. To estimate the edge direction precisely, not only simple difference between adjacent two lines but also edge patterns are used. Here, we analyze properties of edge patterns and model them as weight functions. The weight functions help the proposed method to estimate the edge direction precisely.

Original languageEnglish
Title of host publicationIEEE International Conference on Image Processing 2005, ICIP 2005
Pages1018-1021
Number of pages4
Volume2
DOIs
Publication statusPublished - 2005 Dec 1
EventIEEE International Conference on Image Processing 2005, ICIP 2005 - Genova, Italy
Duration: 2005 Sep 112005 Sep 14

Other

OtherIEEE International Conference on Image Processing 2005, ICIP 2005
CountryItaly
CityGenova
Period05/9/1105/9/14

Fingerprint

Electronic data interchange

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Byun, M., Park, M. K., & Kang, M. G. (2005). EDI-based deinterlacing using edge patterns. In IEEE International Conference on Image Processing 2005, ICIP 2005 (Vol. 2, pp. 1018-1021). [1530231] https://doi.org/10.1109/ICIP.2005.1530231
Byun, Min ; Park, Min Kyu ; Kang, Moon Gi. / EDI-based deinterlacing using edge patterns. IEEE International Conference on Image Processing 2005, ICIP 2005. Vol. 2 2005. pp. 1018-1021
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Byun, M, Park, MK & Kang, MG 2005, EDI-based deinterlacing using edge patterns. in IEEE International Conference on Image Processing 2005, ICIP 2005. vol. 2, 1530231, pp. 1018-1021, IEEE International Conference on Image Processing 2005, ICIP 2005, Genova, Italy, 05/9/11. https://doi.org/10.1109/ICIP.2005.1530231

EDI-based deinterlacing using edge patterns. / Byun, Min; Park, Min Kyu; Kang, Moon Gi.

IEEE International Conference on Image Processing 2005, ICIP 2005. Vol. 2 2005. p. 1018-1021 1530231.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Byun M, Park MK, Kang MG. EDI-based deinterlacing using edge patterns. In IEEE International Conference on Image Processing 2005, ICIP 2005. Vol. 2. 2005. p. 1018-1021. 1530231 https://doi.org/10.1109/ICIP.2005.1530231