Effect of contact statistics on electrical contact resistance

Yong Hoon Jang, J. R. Barber

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

A model for the electrical contact of rough surfaces, extending Greenwood's equation for conduction through a cluster of circular contacts to a system in which the probability of a contact spot at a given location was defined in statistical term, was presented. An idealized fractal rough surface was defined using the random midpoint displacement algorithm. The size distribution of contact spot was assumed to be given by the intersection of the surface with a constant height plane. It was found that inclusion of the finer scale detail in the fractal surface, equivalent to reducing the sampling length in the measurement of the surface, caused the predicted resistance to approach the perfect contact limit.

Original languageEnglish
Pages (from-to)7215-7221
Number of pages7
JournalJournal of Applied Physics
Volume94
Issue number11
DOIs
Publication statusPublished - 2003 Dec 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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