Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics

Pyung Moon, Jun Yeong Lim, Tae Un Youn, Keum Whan Noh, Ilgu Yun

Research output: Contribution to journalArticle

Abstract

Retention characteristic represents a capability to maintain the storage data and it is related with the reliability of memory device. The retention characteristic is degraded by the leakage of charges from a floating gate to a control gate, and thus the leakage current at low and moderate electric field of inter-poly dielectric (IPD) is one of the important characteristic for floating gate type flash memories. In addition, it is necessary to investigate the effects of the electric field polarity on the electric characteristics of IPD because the electric field polarity is changed as the cell operations such as the programming and erasing. Therefore, in this paper, the variation of the leakage current of IPD at moderate electric field region is measured with varying the previously applied electric field polarity. Based on the result, the effect of sequential change of an applied electric field polarity on the electrical characteristics is analyzed.

Original languageEnglish
Pages (from-to)795-798
Number of pages4
JournalMicroelectronics Reliability
Volume55
Issue number5
DOIs
Publication statusPublished - 2015 Apr 1

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polarity
Electric fields
electric fields
cells
leakage
Leakage currents
floating
Data storage equipment
Flash memory
data storage
programming
flash

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Cite this

Moon, Pyung ; Lim, Jun Yeong ; Youn, Tae Un ; Noh, Keum Whan ; Yun, Ilgu. / Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. In: Microelectronics Reliability. 2015 ; Vol. 55, No. 5. pp. 795-798.
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Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. / Moon, Pyung; Lim, Jun Yeong; Youn, Tae Un; Noh, Keum Whan; Yun, Ilgu.

In: Microelectronics Reliability, Vol. 55, No. 5, 01.04.2015, p. 795-798.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics

AU - Moon, Pyung

AU - Lim, Jun Yeong

AU - Youn, Tae Un

AU - Noh, Keum Whan

AU - Yun, Ilgu

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AB - Retention characteristic represents a capability to maintain the storage data and it is related with the reliability of memory device. The retention characteristic is degraded by the leakage of charges from a floating gate to a control gate, and thus the leakage current at low and moderate electric field of inter-poly dielectric (IPD) is one of the important characteristic for floating gate type flash memories. In addition, it is necessary to investigate the effects of the electric field polarity on the electric characteristics of IPD because the electric field polarity is changed as the cell operations such as the programming and erasing. Therefore, in this paper, the variation of the leakage current of IPD at moderate electric field region is measured with varying the previously applied electric field polarity. Based on the result, the effect of sequential change of an applied electric field polarity on the electrical characteristics is analyzed.

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