Effect of grain size of Pb(Zr0.4Ti0.6)O3 sol-gel derived thin films on the ferroelectric properties

Jun Kyu Yang, Woo Sik Kim, Hyung-Ho Park

Research output: Contribution to journalArticle

53 Citations (Scopus)

Abstract

Lead zirconate titanate (PZT) (Zr/Ti = 40/60) thin films on Pt/SiO2/Si substrate with greatly different grain size were attained well with controlled atomic composition and crystalline orientation by varying the starting solution composition and annealing time. Small and large grained films with (1 1 1)-preferred orientation were obtained and their grain sizes were approximately 110 and 370 nm, respectively. Since annealing treatment induced the alternation of microstructure and stress at the interface, the effect of grain size was discussed in a standpoint of microstructural characteristic. Measurements of ferroelectric and electric properties revealed that small grained film presents more gradual polarization behavior, less degradation of polarization through switching cycles, and lower leakage current density than large grained film.

Original languageEnglish
Pages (from-to)544-548
Number of pages5
JournalApplied Surface Science
Volume169-170
DOIs
Publication statusPublished - 2001 Jan 15

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Ferroelectric materials
Sol-gels
Thin films
Annealing
Polarization
Chemical analysis
Leakage currents
Crystal orientation
Electric properties
Current density
Crystalline materials
Degradation
Microstructure
Substrates
lead titanate zirconate

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

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Effect of grain size of Pb(Zr0.4Ti0.6)O3 sol-gel derived thin films on the ferroelectric properties. / Yang, Jun Kyu; Kim, Woo Sik; Park, Hyung-Ho.

In: Applied Surface Science, Vol. 169-170, 15.01.2001, p. 544-548.

Research output: Contribution to journalArticle

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