Effect of penetration depth on electrical properties in Pd/Ge/Ti/Au ohmic contact to high-low-doped n-GaAs

Joon Seop Kwak, Jong Lam Lee, Hong Koo Baik, Dong Won Shin, Chan Gyung Park, Haecheon Kim

Research output: Contribution to journalArticle

3 Citations (Scopus)

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Engineering & Materials Science

Physics & Astronomy