Effect of PrBa2Cu3O7-x buffer layer thickness on the properties of YBa2Cu3O7-x thin films grown on sapphire by laser ablation

Sang Yeol Lee, Hyung-Ho Park

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Superconducting YBa2Cu3O7-x (YBCO) thin films were deposited on r-plane Al2O3 substrates with PrBa2Cu3O7-x (PBCO) buffer layer by XeCl excimer laser ablation. The thickness of PBCO buffer layer was systematically changed to investigate the superconducting properties of YBCO thin films on sapphire. The structure and surface morphology of the films were characterized by X-ray diffraction and scanning electron microscopy (SEM). Superconducting transition temperatures were varied depending on the buffer layer thickness. Interdiffusion between laser-ablated YBCO thin films and Al2O3 substrates had been studied by Auger electron spectroscopy (AES). The results of this study show that diffusion does not occur between the YBCO thin film and the substrate even with 20 Å thick PBCO buffer layer.

Original languageEnglish
Pages (from-to)545-549
Number of pages5
JournalJournal of Superconductivity
Volume9
Issue number5
DOIs
Publication statusPublished - 1996 Jan 1

Fingerprint

Aluminum Oxide
Laser ablation
Buffer layers
Sapphire
laser ablation
sapphire
buffers
Thin films
thin films
Substrates
Excimer lasers
Auger electron spectroscopy
excimer lasers
Superconducting transition temperature
Auger spectroscopy
Surface morphology
electron spectroscopy
transition temperature
X ray diffraction
Scanning electron microscopy

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)

Cite this

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abstract = "Superconducting YBa2Cu3O7-x (YBCO) thin films were deposited on r-plane Al2O3 substrates with PrBa2Cu3O7-x (PBCO) buffer layer by XeCl excimer laser ablation. The thickness of PBCO buffer layer was systematically changed to investigate the superconducting properties of YBCO thin films on sapphire. The structure and surface morphology of the films were characterized by X-ray diffraction and scanning electron microscopy (SEM). Superconducting transition temperatures were varied depending on the buffer layer thickness. Interdiffusion between laser-ablated YBCO thin films and Al2O3 substrates had been studied by Auger electron spectroscopy (AES). The results of this study show that diffusion does not occur between the YBCO thin film and the substrate even with 20 {\AA} thick PBCO buffer layer.",
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Effect of PrBa2Cu3O7-x buffer layer thickness on the properties of YBa2Cu3O7-x thin films grown on sapphire by laser ablation. / Lee, Sang Yeol; Park, Hyung-Ho.

In: Journal of Superconductivity, Vol. 9, No. 5, 01.01.1996, p. 545-549.

Research output: Contribution to journalArticle

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AB - Superconducting YBa2Cu3O7-x (YBCO) thin films were deposited on r-plane Al2O3 substrates with PrBa2Cu3O7-x (PBCO) buffer layer by XeCl excimer laser ablation. The thickness of PBCO buffer layer was systematically changed to investigate the superconducting properties of YBCO thin films on sapphire. The structure and surface morphology of the films were characterized by X-ray diffraction and scanning electron microscopy (SEM). Superconducting transition temperatures were varied depending on the buffer layer thickness. Interdiffusion between laser-ablated YBCO thin films and Al2O3 substrates had been studied by Auger electron spectroscopy (AES). The results of this study show that diffusion does not occur between the YBCO thin film and the substrate even with 20 Å thick PBCO buffer layer.

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