Effect of sputtered films on morphology of vertical aligned ZnO nanowires

J. P. Kar, S. W. Lee, W. Lee, Jae Min Myoung

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

Vertical aligned ZnO nanowires were grown by MOCVD technique on silicon substrate using ZnO and AlN thin films as seed layers. The shape of nanostructures was greatly influenced by the under laying surface. Vertical nanopencils were observed on ZnO/Si, whereas the nanowires on both sapphire and AlN/Si substrate have the similar aspect ratio. XRD patterns suggest that the nanostructures have good crystallinity. High-resolution transmission electron microscopy (HRTEM) confirmed the single crystalline growth of the ZnO nanowires along [0 0 1] direction. Room-temperature photoluminescence (PL) spectra of ZnO nanowires on AlN/Si clearly show a band-edge luminescence accompanied with a visible emission. More interestingly, no visible emission for the nanopencils on ZnO/Si substrates, were observed.

Original languageEnglish
Pages (from-to)6677-6682
Number of pages6
JournalApplied Surface Science
Volume254
Issue number20
DOIs
Publication statusPublished - 2008 Aug 15

Fingerprint

Nanowires
Nanostructures
Substrates
Aluminum Oxide
Metallorganic chemical vapor deposition
Silicon
High resolution transmission electron microscopy
Sapphire
Seed
Luminescence
Aspect ratio
Photoluminescence
Crystalline materials
Thin films
Temperature

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Kar, J. P. ; Lee, S. W. ; Lee, W. ; Myoung, Jae Min. / Effect of sputtered films on morphology of vertical aligned ZnO nanowires. In: Applied Surface Science. 2008 ; Vol. 254, No. 20. pp. 6677-6682.
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Effect of sputtered films on morphology of vertical aligned ZnO nanowires. / Kar, J. P.; Lee, S. W.; Lee, W.; Myoung, Jae Min.

In: Applied Surface Science, Vol. 254, No. 20, 15.08.2008, p. 6677-6682.

Research output: Contribution to journalArticle

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