Abstract
Abnormal drift rate of Thomas type 1 ohm resistors according to temporary temperature change is described and they compared with NML 1 ohm resistors with almost the same drift rate under the change. It is thought that major origin of difference between two type is coil-mounting structure suffering from stress.
| Original language | English |
|---|---|
| Pages (from-to) | 524-525 |
| Number of pages | 2 |
| Journal | CPEM Digest (Conference on Precision Electromagnetic Measurements) |
| Publication status | Published - 1998 |
| Event | Proceedings of the 1998 Conference Precision Electromagnetic Measurements - Washington, DC, USA Duration: 1998 Jul 6 → 1998 Jul 10 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Electrical and Electronic Engineering