Effect of temporary temperature change on drift rate of KRISS legal ohm

Kwang Min Yu, Young Tae Park, Kwon Su Han, Kyung-hwa Yoo

Research output: Contribution to journalConference article

Abstract

Abnormal drift rate of Thomas type 1 ohm resistors according to temporary temperature change is described and they compared with NML 1 ohm resistors with almost the same drift rate under the change. It is thought that major origin of difference between two type is coil-mounting structure suffering from stress.

Original languageEnglish
Pages (from-to)524-525
Number of pages2
JournalCPEM Digest (Conference on Precision Electromagnetic Measurements)
Publication statusPublished - 1998 Dec 1
EventProceedings of the 1998 Conference Precision Electromagnetic Measurements - Washington, DC, USA
Duration: 1998 Jul 61998 Jul 10

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Electrical and Electronic Engineering

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