Effect of temporary temperature change on drift rate of KRISS legal ohm

Kwang Min Yu; Young Tae Park; Kwon Su Han; Kyung Hwa Yoo

Effect of temporary temperature change on drift rate of KRISS legal ohm

Kwang Min Yu, Young Tae Park, Kwon Su Han, Kyung Hwa Yoo

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

Abnormal drift rate of Thomas type 1 ohm resistors according to temporary temperature change is described and they compared with NML 1 ohm resistors with almost the same drift rate under the change. It is thought that major origin of difference between two type is coil-mounting structure suffering from stress.

Original language	English
Pages (from-to)	524-525
Number of pages	2
Journal	CPEM Digest (Conference on Precision Electromagnetic Measurements)
Publication status	Published - 1998
Event	Proceedings of the 1998 Conference Precision Electromagnetic Measurements - Washington, DC, USA Duration: 1998 Jul 6 → 1998 Jul 10

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Instrumentation
Electrical and Electronic Engineering

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@article{55f974e50c264e1eb59cb75643b18fc4,

title = "Effect of temporary temperature change on drift rate of KRISS legal ohm",

abstract = "Abnormal drift rate of Thomas type 1 ohm resistors according to temporary temperature change is described and they compared with NML 1 ohm resistors with almost the same drift rate under the change. It is thought that major origin of difference between two type is coil-mounting structure suffering from stress.",

author = "Yu, {Kwang Min} and Park, {Young Tae} and Han, {Kwon Su} and Yoo, {Kyung Hwa}",

note = "Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.; Proceedings of the 1998 Conference Precision Electromagnetic Measurements ; Conference date: 06-07-1998 Through 10-07-1998",

year = "1998",

language = "English",

pages = "524--525",

journal = "CPEM Digest (Conference on Precision Electromagnetic Measurements)",

issn = "0589-1485",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Effect of temporary temperature change on drift rate of KRISS legal ohm

AU - Yu, Kwang Min

AU - Park, Young Tae

AU - Han, Kwon Su

AU - Yoo, Kyung Hwa

PY - 1998

Y1 - 1998

N2 - Abnormal drift rate of Thomas type 1 ohm resistors according to temporary temperature change is described and they compared with NML 1 ohm resistors with almost the same drift rate under the change. It is thought that major origin of difference between two type is coil-mounting structure suffering from stress.

AB - Abnormal drift rate of Thomas type 1 ohm resistors according to temporary temperature change is described and they compared with NML 1 ohm resistors with almost the same drift rate under the change. It is thought that major origin of difference between two type is coil-mounting structure suffering from stress.

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UR - http://www.scopus.com/inward/citedby.url?scp=0032297189&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0032297189

SP - 524

EP - 525

JO - CPEM Digest (Conference on Precision Electromagnetic Measurements)

JF - CPEM Digest (Conference on Precision Electromagnetic Measurements)

SN - 0589-1485

T2 - Proceedings of the 1998 Conference Precision Electromagnetic Measurements

Y2 - 6 July 1998 through 10 July 1998

ER -