Effect of the angle accuracy in reduced-phase dual-illumination interferometer

Behnam Tayebi, Mohammad Reza Jafar Fard, Farnaz Sharif, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Reduced-phase dual-illumination interferometer (RPDII) is an off axis, single shot and single wavelength phase imaging technique to measure large objects without using unwrapping algorithms. Two beams of this interferometer illuminate a sample at different incident angles, two phases of the different incident angles and their phase difference are recorded. The phase difference between two beams can be controlled by adjusting the incident angles. The angle accuracy that decrease the RPDII accuracy have been studied. We have shown, the groove spacing of the grating and magnification of the lens system before sample, determine the incident angle accuracy. The ability of RPDII to unwrap large phases is shown by reconstructing phase of a step object without using unwrapping algorithms. The reconstructed image shows that the total inaccuracy is much more than the inaccuracy caused by incident angles.

Original languageEnglish
Title of host publicationHolography, Diffractive Optics, and Applications VI
EditorsYunlong Sheng, Changhe Zhou, Chongxiu Yu
PublisherSPIE
ISBN (Electronic)9781628413441
DOIs
Publication statusPublished - 2014 Jan 1
EventHolography, Diffractive Optics, and Applications VI - Beijing, China
Duration: 2014 Oct 92014 Oct 11

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9271
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherHolography, Diffractive Optics, and Applications VI
CountryChina
CityBeijing
Period14/10/914/10/11

Fingerprint

Interferometer
Interferometers
Illumination
interferometers
Lighting
illumination
Angle
Phase Difference
Lenses
magnification
Imaging techniques
imaging techniques
grooves
Wavelength
Gratings
shot
Spacing
Lens
adjusting
lenses

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Tayebi, B., Fard, M. R. J., Sharif, F., & Kim, D. Y. (2014). Effect of the angle accuracy in reduced-phase dual-illumination interferometer. In Y. Sheng, C. Zhou, & C. Yu (Eds.), Holography, Diffractive Optics, and Applications VI [92711V] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9271). SPIE. https://doi.org/10.1117/12.2074457
Tayebi, Behnam ; Fard, Mohammad Reza Jafar ; Sharif, Farnaz ; Kim, Dug Young. / Effect of the angle accuracy in reduced-phase dual-illumination interferometer. Holography, Diffractive Optics, and Applications VI. editor / Yunlong Sheng ; Changhe Zhou ; Chongxiu Yu. SPIE, 2014. (Proceedings of SPIE - The International Society for Optical Engineering).
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Tayebi, B, Fard, MRJ, Sharif, F & Kim, DY 2014, Effect of the angle accuracy in reduced-phase dual-illumination interferometer. in Y Sheng, C Zhou & C Yu (eds), Holography, Diffractive Optics, and Applications VI., 92711V, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9271, SPIE, Holography, Diffractive Optics, and Applications VI, Beijing, China, 14/10/9. https://doi.org/10.1117/12.2074457

Effect of the angle accuracy in reduced-phase dual-illumination interferometer. / Tayebi, Behnam; Fard, Mohammad Reza Jafar; Sharif, Farnaz; Kim, Dug Young.

Holography, Diffractive Optics, and Applications VI. ed. / Yunlong Sheng; Changhe Zhou; Chongxiu Yu. SPIE, 2014. 92711V (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9271).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Tayebi B, Fard MRJ, Sharif F, Kim DY. Effect of the angle accuracy in reduced-phase dual-illumination interferometer. In Sheng Y, Zhou C, Yu C, editors, Holography, Diffractive Optics, and Applications VI. SPIE. 2014. 92711V. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2074457