Abstract
Reduced-phase dual-illumination interferometer (RPDII) is an off axis, single shot and single wavelength phase imaging technique to measure large objects without using unwrapping algorithms. Two beams of this interferometer illuminate a sample at different incident angles, two phases of the different incident angles and their phase difference are recorded. The phase difference between two beams can be controlled by adjusting the incident angles. The angle accuracy that decrease the RPDII accuracy have been studied. We have shown, the groove spacing of the grating and magnification of the lens system before sample, determine the incident angle accuracy. The ability of RPDII to unwrap large phases is shown by reconstructing phase of a step object without using unwrapping algorithms. The reconstructed image shows that the total inaccuracy is much more than the inaccuracy caused by incident angles.
| Original language | English |
|---|---|
| Title of host publication | Holography, Diffractive Optics, and Applications VI |
| Editors | Yunlong Sheng, Changhe Zhou, Chongxiu Yu |
| Publisher | SPIE |
| ISBN (Electronic) | 9781628413441 |
| DOIs | |
| Publication status | Published - 2014 Jan 1 |
| Event | Holography, Diffractive Optics, and Applications VI - Beijing, China Duration: 2014 Oct 9 → 2014 Oct 11 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 9271 |
| ISSN (Print) | 0277-786X |
| ISSN (Electronic) | 1996-756X |
Other
| Other | Holography, Diffractive Optics, and Applications VI |
|---|---|
| Country | China |
| City | Beijing |
| Period | 14/10/9 → 14/10/11 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Cite this
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Effect of the angle accuracy in reduced-phase dual-illumination interferometer. / Tayebi, Behnam; Fard, Mohammad Reza Jafar; Sharif, Farnaz; Kim, Dug Young.
Holography, Diffractive Optics, and Applications VI. ed. / Yunlong Sheng; Changhe Zhou; Chongxiu Yu. SPIE, 2014. 92711V (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9271).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Effect of the angle accuracy in reduced-phase dual-illumination interferometer
AU - Tayebi, Behnam
AU - Fard, Mohammad Reza Jafar
AU - Sharif, Farnaz
AU - Kim, Dug Young
PY - 2014/1/1
Y1 - 2014/1/1
N2 - Reduced-phase dual-illumination interferometer (RPDII) is an off axis, single shot and single wavelength phase imaging technique to measure large objects without using unwrapping algorithms. Two beams of this interferometer illuminate a sample at different incident angles, two phases of the different incident angles and their phase difference are recorded. The phase difference between two beams can be controlled by adjusting the incident angles. The angle accuracy that decrease the RPDII accuracy have been studied. We have shown, the groove spacing of the grating and magnification of the lens system before sample, determine the incident angle accuracy. The ability of RPDII to unwrap large phases is shown by reconstructing phase of a step object without using unwrapping algorithms. The reconstructed image shows that the total inaccuracy is much more than the inaccuracy caused by incident angles.
AB - Reduced-phase dual-illumination interferometer (RPDII) is an off axis, single shot and single wavelength phase imaging technique to measure large objects without using unwrapping algorithms. Two beams of this interferometer illuminate a sample at different incident angles, two phases of the different incident angles and their phase difference are recorded. The phase difference between two beams can be controlled by adjusting the incident angles. The angle accuracy that decrease the RPDII accuracy have been studied. We have shown, the groove spacing of the grating and magnification of the lens system before sample, determine the incident angle accuracy. The ability of RPDII to unwrap large phases is shown by reconstructing phase of a step object without using unwrapping algorithms. The reconstructed image shows that the total inaccuracy is much more than the inaccuracy caused by incident angles.
UR - http://www.scopus.com/inward/record.url?scp=84929496768&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84929496768&partnerID=8YFLogxK
U2 - 10.1117/12.2074457
DO - 10.1117/12.2074457
M3 - Conference contribution
AN - SCOPUS:84929496768
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Holography, Diffractive Optics, and Applications VI
A2 - Sheng, Yunlong
A2 - Zhou, Changhe
A2 - Yu, Chongxiu
PB - SPIE
ER -