Effect of the contact geometry on nanoscale and sub-nanoscale friction behaviors

Hong Min Yoon, Joon Sang Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Stick-slip motion is the most well-known phenomenon in nano-tribology. Maier et al. previously studied the dependency of slip time on contact geometry. In their work, they were able to identify the intermediate state during slip motion. However, detailed study of this intermediate state is difficult due to the fast dynamics. In a friction force microscopy experiment, various parameters, such as surface roughness, temperature, defects, and oxidation condition, affect the tribological behaviors. Hence, current experimental techniques only measure the average or maximum friction and describe the simple shape of stick-slip motion. Molecular dynamics simulation represents an effective solution for this issue. Dong et al. reviewed the molecular dynamics simulation approach with regard to the nano-tribology. The advantage of molecular dynamics simulation is that it can provide detailed information and direct visualization of the tribological phenomena on a time scale of a few nanoseconds. In this study, we investigate the detailed mechanism of stick-slip motion in nanoscale. Molecular dynamics simulation precisely mimics friction force microscopy experiments. In molecular dynamics simulations, a crystalline Si tip slides on a graphene surface, and the tip size is varied. The simulation results provide evidence of the intermediate state during slip motion and reveal the hierarchical structure of the stick-slip motion in nanoscale. Detailed relations among stick-slip motion, contact geometry, and energy state are also analyzed.

Original languageEnglish
Title of host publication2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509021246
DOIs
Publication statusPublished - 2016 Jul 27
Event2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016 - Seoul, Korea, Republic of
Duration: 2016 Jul 132016 Jul 15

Publication series

Name2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016

Other

Other2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016
CountryKorea, Republic of
CitySeoul
Period16/7/1316/7/15

Fingerprint

Stick-slip
Molecular dynamics
Friction
Geometry
Computer simulation
Tribology
Microscopic examination
Graphene
Electron energy levels
Visualization
Surface roughness
Experiments
Crystalline materials
Oxidation
Defects
Temperature

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

Cite this

Yoon, H. M., & Lee, J. S. (2016). Effect of the contact geometry on nanoscale and sub-nanoscale friction behaviors. In 2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016 [7524286] (2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APMRC.2016.7524286
Yoon, Hong Min ; Lee, Joon Sang. / Effect of the contact geometry on nanoscale and sub-nanoscale friction behaviors. 2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016. Institute of Electrical and Electronics Engineers Inc., 2016. (2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016).
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Yoon, HM & Lee, JS 2016, Effect of the contact geometry on nanoscale and sub-nanoscale friction behaviors. in 2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016., 7524286, 2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016, Institute of Electrical and Electronics Engineers Inc., 2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016, Seoul, Korea, Republic of, 16/7/13. https://doi.org/10.1109/APMRC.2016.7524286

Effect of the contact geometry on nanoscale and sub-nanoscale friction behaviors. / Yoon, Hong Min; Lee, Joon Sang.

2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7524286 (2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Yoon HM, Lee JS. Effect of the contact geometry on nanoscale and sub-nanoscale friction behaviors. In 2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016. Institute of Electrical and Electronics Engineers Inc. 2016. 7524286. (2016 Asia-Pacific Magnetic Recording Conference, APMRC 2016). https://doi.org/10.1109/APMRC.2016.7524286