Abstract
The structural effect on field emission property of the SiC whiskers of 80 nm diameter grown by chemical vapor deposition was analyzed. The coating microstructure and surface morphology were investigated using scanning electron microscopy (SEM). The field emission properties were affected by the band gap, electron affinity and microstructral morphology. The results show that the sharper the morphology of the emission tip, the better is the electron emission.
| Original language | English |
|---|---|
| Pages (from-to) | 3025-3026 |
| Number of pages | 2 |
| Journal | Journal of Materials Science |
| Volume | 40 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 2005 Jun 1 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering
Cite this
}
Effect of whisker diameter on field emission properties of silicon carbide whiskers grown by chemical vapor deposition. / Lim, Dong Chan; Joo, Byoung In; Jun, Jin Hyung; Choi, Doo Jin.
In: Journal of Materials Science, Vol. 40, No. 11, 01.06.2005, p. 3025-3026.Research output: Contribution to journal › Article
TY - JOUR
T1 - Effect of whisker diameter on field emission properties of silicon carbide whiskers grown by chemical vapor deposition
AU - Lim, Dong Chan
AU - Joo, Byoung In
AU - Jun, Jin Hyung
AU - Choi, Doo Jin
PY - 2005/6/1
Y1 - 2005/6/1
N2 - The structural effect on field emission property of the SiC whiskers of 80 nm diameter grown by chemical vapor deposition was analyzed. The coating microstructure and surface morphology were investigated using scanning electron microscopy (SEM). The field emission properties were affected by the band gap, electron affinity and microstructral morphology. The results show that the sharper the morphology of the emission tip, the better is the electron emission.
AB - The structural effect on field emission property of the SiC whiskers of 80 nm diameter grown by chemical vapor deposition was analyzed. The coating microstructure and surface morphology were investigated using scanning electron microscopy (SEM). The field emission properties were affected by the band gap, electron affinity and microstructral morphology. The results show that the sharper the morphology of the emission tip, the better is the electron emission.
UR - http://www.scopus.com/inward/record.url?scp=21644460949&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=21644460949&partnerID=8YFLogxK
U2 - 10.1007/s10853-005-2388-7
DO - 10.1007/s10853-005-2388-7
M3 - Article
AN - SCOPUS:21644460949
VL - 40
SP - 3025
EP - 3026
JO - Journal of Materials Science
JF - Journal of Materials Science
SN - 0022-2461
IS - 11
ER -