Effects of thermal and electrical stress on defect generation in InAs metal–oxide–semiconductor capacitor

Min Baik, Hang Kyu Kang, Yu Seon Kang, Kwang Sik Jeong, Changmin Lee, Hyoungsub Kim, Jin Dong Song, Mann Ho Cho

Research output: Contribution to journalArticle

5 Citations (Scopus)

Fingerprint Dive into the research topics of 'Effects of thermal and electrical stress on defect generation in InAs metal–oxide–semiconductor capacitor'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy