Effects of thickness variation on properties of ZnO thin films grown by pulsed laser deposition

Jae Min Myoung, Wook Hi Yoon, Dong Hi Lee, Ilgu Yun, Sang Hyuck Bae, Sang Yeol Lee

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A series of ZnO films with various thicknesses were prepared on (0001) sapphire substrate by pulsed laser deposition (PLD). Scanning electron microscopy (SEM) and x-ray diffraction (XRD) analysis were utilized to investigate the effects of thickness variation on the surface morphology and the crystallinity. The electrical and optical properties of the films were also investigated as a function of the film thickness. It was found that the crystalline quality, electrical and optical properties of the films depended on the film thickness and were improved with increasing the film thickness. This is attributed to the fact that the films thinner than 4000 Å are under the severe misfit strain, which decreases with increasing the film thickness further.

Original languageEnglish
Pages (from-to)28-31
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number1
Publication statusPublished - 2002 Jan 1


All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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