Efficiency analysis of importance sampling in deep submicron STT-RAM design using uncontrollable industry-compatible model parameter

Taehui Na, Hanwool Jeong, Seong Ook Jung, Jung Pill Kim, Seung H. Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, we first analyze the efficiency of importance sampling (IS) method in spin transfer torque random access memory (STT-RAM) design with industry-compatible model parameter. Commonly used normal fitting method cannot estimate the yield accurately unless an output distribution follows the Gaussian distribution. The efficiency of IS method is significantly degraded when industry-compatible model parameters are used because most variables affected by process variation are not controllable. With industry-compatible 45-nm model parameters, Monte Carlo HSPICE simulation results show that the required number of simulations to satisfy error rate less than 5% should be greater than 50,000.

Original languageEnglish
Title of host publication2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages400-403
Number of pages4
ISBN (Electronic)9781509002467
DOIs
Publication statusPublished - 2016 Mar 23
EventIEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015 - Cairo, Egypt
Duration: 2015 Dec 62015 Dec 9

Publication series

NameProceedings of the IEEE International Conference on Electronics, Circuits, and Systems
Volume2016-March

Other

OtherIEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015
CountryEgypt
CityCairo
Period15/12/615/12/9

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Na, T., Jeong, H., Jung, S. O., Kim, J. P., & Kang, S. H. (2016). Efficiency analysis of importance sampling in deep submicron STT-RAM design using uncontrollable industry-compatible model parameter. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015 (pp. 400-403). [7440333] (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems; Vol. 2016-March). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICECS.2015.7440333