Due to the rapidly growing complexity of VLSI circuits, test methodologies based on delay testing become popular. However, most approaches cannot handle custom logic blocks which are described by logic functions rather than by circuit primitive elements. To overcome this problem, a new path delay test generation algorithm is developed for custom designs. The results using benchmark circuits and real designs prove the efficiency of the new algorithm. The new test generation algorithm can be applied to designs employing intellectual property (IP) circuits whose implementation details are either unknown or unavailable.
|Number of pages||12|
|Publication status||Published - 2001 Sep 1|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Computer Science(all)
- Electrical and Electronic Engineering