Efficient redundancy identification for test pattern generation

Sangyun Han, Sungho Kang

Research output: Contribution to journalConference article

Abstract

Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.

Original languageEnglish
Pages (from-to)52-56
Number of pages5
JournalProceedings of the Annual IEEE International ASIC Conference and Exhibit
Publication statusPublished - 1997 Jan 1

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Redundancy
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

@article{5d04a318e71a49dbb45a737a4632cfde,
title = "Efficient redundancy identification for test pattern generation",
abstract = "Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.",
author = "Sangyun Han and Sungho Kang",
year = "1997",
month = "1",
day = "1",
language = "English",
pages = "52--56",
journal = "Proceedings of the Annual IEEE International ASIC Conference and Exhibit",
issn = "1063-0988",

}

Efficient redundancy identification for test pattern generation. / Han, Sangyun; Kang, Sungho.

In: Proceedings of the Annual IEEE International ASIC Conference and Exhibit, 01.01.1997, p. 52-56.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Efficient redundancy identification for test pattern generation

AU - Han, Sangyun

AU - Kang, Sungho

PY - 1997/1/1

Y1 - 1997/1/1

N2 - Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.

AB - Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.

UR - http://www.scopus.com/inward/record.url?scp=0030655973&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030655973&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0030655973

SP - 52

EP - 56

JO - Proceedings of the Annual IEEE International ASIC Conference and Exhibit

JF - Proceedings of the Annual IEEE International ASIC Conference and Exhibit

SN - 1063-0988

ER -