Efficient redundancy identification for test pattern generation

Sangyun Han, Sungho Kang

Research output: Contribution to journalConference article

Abstract

Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.

Original languageEnglish
Pages (from-to)52-56
Number of pages5
JournalProceedings of the Annual IEEE International ASIC Conference and Exhibit
Publication statusPublished - 1997 Jan 1

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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