Efficient test generation using redundancy identification

Sangyoon Han, Sungho Kang

Research output: Contribution to journalArticle

Abstract

To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.

Original languageEnglish
Pages (from-to)1814-1815
Number of pages2
JournalIEICE Transactions on Information and Systems
VolumeE83-D
Issue number9
Publication statusPublished - 2000 Jan 1

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Redundancy

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

Cite this

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Efficient test generation using redundancy identification. / Han, Sangyoon; Kang, Sungho.

In: IEICE Transactions on Information and Systems, Vol. E83-D, No. 9, 01.01.2000, p. 1814-1815.

Research output: Contribution to journalArticle

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