Efficient test generation using redundancy identification

Sangyoon Han, Sungho Kang

Research output: Contribution to journalArticlepeer-review


To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.

Original languageEnglish
Pages (from-to)1814-1815
Number of pages2
JournalIEICE Transactions on Information and Systems
Issue number9
Publication statusPublished - 2000

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence


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