Efficient test generation using redundancy identification

Sangyoon Han; Sungho Kang

Efficient test generation using redundancy identification

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.

Original language	English
Pages (from-to)	1814-1815
Number of pages	2
Journal	IEICE Transactions on Information and Systems
Volume	E83-D
Issue number	9
Publication status	Published - 2000

All Science Journal Classification (ASJC) codes

Software
Hardware and Architecture
Computer Vision and Pattern Recognition
Electrical and Electronic Engineering
Artificial Intelligence

Cite this

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Efficient test generation using redundancy identification

Abstract

All Science Journal Classification (ASJC) codes

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