EFuse based IC authentication architecture

Seung Yeob Lee, Joon Sung Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In the era of IoT (Internet of Things), more devices now frequently carry confidential data. At the same time, the risk of invasive attacks also increases. Hence, the security against these attacks has become more critical. In this paper, we propose eFuse-based authentication logic. This logic generates a unique value of each IC using eFuse trimming information. In the authentication process, the unique value is used to distinguish authentic ICs from copied ones. Since the eFuse trimming information resides in ICs, the proposed method can be implemented with lightweight architectures. Experimental results in 0.13-um technology show that the proposed method can reliably authenticate ICs in various operating conditions.

Original languageEnglish
Title of host publicationISOCC 2016 - International SoC Design Conference
Subtitle of host publicationSmart SoC for Intelligent Things
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages145-146
Number of pages2
ISBN (Electronic)9781467393089
DOIs
Publication statusPublished - 2016 Dec 27
Event13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of
Duration: 2016 Oct 232016 Oct 26

Publication series

NameISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things

Other

Other13th International SoC Design Conference, ISOCC 2016
CountryKorea, Republic of
CityJeju
Period16/10/2316/10/26

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All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Lee, S. Y., & Yang, J. S. (2016). EFuse based IC authentication architecture. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things (pp. 145-146). [7799829] (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2016.7799829