Electric and ferroelectric properties of PZT/SBT multilayer films prepared by photochemical metal-organic deposition

Hyeong Ho Park; Hyung Ho Park; Tae Song Kim; Ross H. Hill

doi:10.1016/j.snb.2007.10.053

Electric and ferroelectric properties of PZT/SBT multilayer films prepared by photochemical metal-organic deposition

Hyeong Ho Park, Hyung Ho Park, Tae Song Kim, Ross H. Hill

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

The electric and ferroelectric properties of lead zirconate titanate and strontium bismuth tantalate multilayer films prepared using photosensitive starting precursors were characterized. The electric and ferroelectric properties were investigated by characterization of the effect of stacking order of four ferroelectric layers of PZT or SBT in the multilayer films of 4-PZT, PZT/2-SBT/PZT, SBT/2-PZT/SBT, and 4-SBT. The P_r value of the 4-SBT multilayer film was relatively small (6 μC/cm²) and a two times higher value (12 μC/cm²) was obtained with the SBT/2-PZT/SBT multilayer film. The films with SBT layers at the top and bottom showed improved leakage current and fatigue resistance compared to the films with PZT layers at the top and bottom. It was revealed that the defect dipole was reduced at the SBT/Pt interface due to a self-regulation layer such as (Bi₂O₂)²⁺ in the SBT film. Also, the bottom layer on the Pt substrate showed a significant influence on the growth orientation of the entire ferroelectric films.

Original language	English
Pages (from-to)	696-700
Number of pages	5
Journal	Sensors and Actuators, B: Chemical
Volume	130
Issue number	2
DOIs	https://doi.org/10.1016/j.snb.2007.10.053
Publication status	Published - 2008 Mar 28

Bibliographical note

Funding Information:
This research was supported by the Intelligent Microsystem Center (IMC: http://www.microsystem.re.kr ), which carries out one of the 21st century's Frontier R&D Projects sponsored by the Korea Ministry of Science and Technology. The experiments at the PLS were supported in part by the MOST and the POSTECH.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Instrumentation
Condensed Matter Physics
Surfaces, Coatings and Films
Metals and Alloys
Electrical and Electronic Engineering
Materials Chemistry

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@article{7a4906e09b5f4d5cbd44283f17cde46e,

title = "Electric and ferroelectric properties of PZT/SBT multilayer films prepared by photochemical metal-organic deposition",

abstract = "The electric and ferroelectric properties of lead zirconate titanate and strontium bismuth tantalate multilayer films prepared using photosensitive starting precursors were characterized. The electric and ferroelectric properties were investigated by characterization of the effect of stacking order of four ferroelectric layers of PZT or SBT in the multilayer films of 4-PZT, PZT/2-SBT/PZT, SBT/2-PZT/SBT, and 4-SBT. The Pr value of the 4-SBT multilayer film was relatively small (6 μC/cm2) and a two times higher value (12 μC/cm2) was obtained with the SBT/2-PZT/SBT multilayer film. The films with SBT layers at the top and bottom showed improved leakage current and fatigue resistance compared to the films with PZT layers at the top and bottom. It was revealed that the defect dipole was reduced at the SBT/Pt interface due to a self-regulation layer such as (Bi2O2)2+ in the SBT film. Also, the bottom layer on the Pt substrate showed a significant influence on the growth orientation of the entire ferroelectric films.",

author = "Park, {Hyeong Ho} and Park, {Hyung Ho} and Kim, {Tae Song} and Hill, {Ross H.}",

note = "Funding Information: This research was supported by the Intelligent Microsystem Center (IMC: http://www.microsystem.re.kr ), which carries out one of the 21st century's Frontier R&D Projects sponsored by the Korea Ministry of Science and Technology. The experiments at the PLS were supported in part by the MOST and the POSTECH. ",

year = "2008",

month = mar,

day = "28",

doi = "10.1016/j.snb.2007.10.053",

language = "English",

volume = "130",

pages = "696--700",

journal = "Sensors and Actuators, B: Chemical",

issn = "0925-4005",

publisher = "Elsevier",

number = "2",

}

TY - JOUR

T1 - Electric and ferroelectric properties of PZT/SBT multilayer films prepared by photochemical metal-organic deposition

AU - Park, Hyeong Ho

AU - Park, Hyung Ho

AU - Kim, Tae Song

AU - Hill, Ross H.

N1 - Funding Information: This research was supported by the Intelligent Microsystem Center (IMC: http://www.microsystem.re.kr ), which carries out one of the 21st century's Frontier R&D Projects sponsored by the Korea Ministry of Science and Technology. The experiments at the PLS were supported in part by the MOST and the POSTECH.

PY - 2008/3/28

Y1 - 2008/3/28

N2 - The electric and ferroelectric properties of lead zirconate titanate and strontium bismuth tantalate multilayer films prepared using photosensitive starting precursors were characterized. The electric and ferroelectric properties were investigated by characterization of the effect of stacking order of four ferroelectric layers of PZT or SBT in the multilayer films of 4-PZT, PZT/2-SBT/PZT, SBT/2-PZT/SBT, and 4-SBT. The Pr value of the 4-SBT multilayer film was relatively small (6 μC/cm2) and a two times higher value (12 μC/cm2) was obtained with the SBT/2-PZT/SBT multilayer film. The films with SBT layers at the top and bottom showed improved leakage current and fatigue resistance compared to the films with PZT layers at the top and bottom. It was revealed that the defect dipole was reduced at the SBT/Pt interface due to a self-regulation layer such as (Bi2O2)2+ in the SBT film. Also, the bottom layer on the Pt substrate showed a significant influence on the growth orientation of the entire ferroelectric films.

AB - The electric and ferroelectric properties of lead zirconate titanate and strontium bismuth tantalate multilayer films prepared using photosensitive starting precursors were characterized. The electric and ferroelectric properties were investigated by characterization of the effect of stacking order of four ferroelectric layers of PZT or SBT in the multilayer films of 4-PZT, PZT/2-SBT/PZT, SBT/2-PZT/SBT, and 4-SBT. The Pr value of the 4-SBT multilayer film was relatively small (6 μC/cm2) and a two times higher value (12 μC/cm2) was obtained with the SBT/2-PZT/SBT multilayer film. The films with SBT layers at the top and bottom showed improved leakage current and fatigue resistance compared to the films with PZT layers at the top and bottom. It was revealed that the defect dipole was reduced at the SBT/Pt interface due to a self-regulation layer such as (Bi2O2)2+ in the SBT film. Also, the bottom layer on the Pt substrate showed a significant influence on the growth orientation of the entire ferroelectric films.

UR - http://www.scopus.com/inward/record.url?scp=40949164722&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=40949164722&partnerID=8YFLogxK

U2 - 10.1016/j.snb.2007.10.053

DO - 10.1016/j.snb.2007.10.053

M3 - Article

AN - SCOPUS:40949164722

VL - 130

SP - 696

EP - 700

JO - Sensors and Actuators, B: Chemical

JF - Sensors and Actuators, B: Chemical

SN - 0925-4005

IS - 2

ER -