Electrical and structural properties of LT-GaAs: influence of As/Ga flux ratio and growth temperature

M. Luysberg, Hyunchul Sohn, A. Prasad, P. Specht, H. Fujioka, R. Klockenbrink, E. R. Weber

Research output: Contribution to journalConference article

7 Citations (Scopus)

Abstract

The deposition of GaAs by MBE at low temperatures results in a material of unique properties. However, up to now the control and understanding of the electrical and structural properties are unsatisfactory. To investigate the influence of growth parameters on the formation of point defects and electrical properties, the substrate temperature and the As/Ga flux ratio were systematically varied. In a well defined parameter range the lattice expansion was found to be dominated by the formation of As antisite defects. After annealing a high resistivity is obtained independent of the growth conditions. A strong influence of the growth temperature on the band conduction mechanism is observed, whereas a variation of the As/Ga flux ratio induces only slight changes of the temperature dependence of the conductivity.

Original languageEnglish
Pages (from-to)485-490
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume442
Publication statusPublished - 1997 Jan 1
EventProceedings of the 1996 MRS Fall Meeting - Boston, MA, USA
Duration: 1996 Dec 21996 Dec 6

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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    Luysberg, M., Sohn, H., Prasad, A., Specht, P., Fujioka, H., Klockenbrink, R., & Weber, E. R. (1997). Electrical and structural properties of LT-GaAs: influence of As/Ga flux ratio and growth temperature. Materials Research Society Symposium - Proceedings, 442, 485-490.