Electrical and thermal stress analysis of In2O 3-Ga2O3-ZnO thin-film transistors

Mami Fujii, Tomoki Maruyama, Masahiro Horita, Kiyoshi Uchiyama, Ji Sim Jung, Jang Yeon Kwon, Yukiharu Uraoka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science