Electro-optical characteristics of vertical alignment cell by ion-beam exposure on the SiC thin film layer

Jeoung Yeon Hwang, Sung Ho Choi, Sang Hoon Kim, Jin Jang, Dae Shik Seo

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We studied the electro-optical (EO) characteristics and nematic liquid crystal (NLC) aligning capabilities with the new alignment material of the Silicon Carbide (SiC) thin film using two kinds of ion beam (IB) gun. The SiC thin film exhibits good chemical and thermal stability. A vertical alignment of nematic liquid crystal by atomic beam exposure on the SiC thin film surface was achieved via all IB exposure system. The generated NLC tilt angle is about 87 using Kaufman type ion gun. The about 88 of stable tilt angle was achieved with incident angle of 10 using duoPIGatron type ion gun. An excellent voltage-transmittance (V-T) and response time curve of the IB-aligned VA-LCD using duoPIGatron type ion gun was observed. The V-T hysteresis characteristics of IB-aligned VA-LCD are almost the same as that of the rubbing-aligned VA-LCD. Consequently, the vertical alignment effect of liquid crystal and the good EO characteristics by the atomic beam alignment method on the SiC thin film layer can be achieved.

Original languageEnglish
Pages (from-to)10-18
Number of pages9
JournalMolecular Crystals and Liquid Crystals
Volume480
Issue number1
DOIs
Publication statusPublished - 2008 Feb 28

Fingerprint

Silicon carbide
silicon carbides
Ion beams
Nematic liquid crystals
Ion sources
Liquid crystal displays
ion beams
liquid crystals
alignment
Atomic beams
Thin films
atomic beams
thin films
cells
transmittance
Liquid Crystals
ions
Chemical stability
Electric potential
electric potential

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Hwang, Jeoung Yeon ; Choi, Sung Ho ; Kim, Sang Hoon ; Jang, Jin ; Seo, Dae Shik. / Electro-optical characteristics of vertical alignment cell by ion-beam exposure on the SiC thin film layer. In: Molecular Crystals and Liquid Crystals. 2008 ; Vol. 480, No. 1. pp. 10-18.
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Electro-optical characteristics of vertical alignment cell by ion-beam exposure on the SiC thin film layer. / Hwang, Jeoung Yeon; Choi, Sung Ho; Kim, Sang Hoon; Jang, Jin; Seo, Dae Shik.

In: Molecular Crystals and Liquid Crystals, Vol. 480, No. 1, 28.02.2008, p. 10-18.

Research output: Contribution to journalArticle

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AU - Choi, Sung Ho

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