Abstract
We investigate electromagnetically amplified local fields or hot spots created by surface nanoantennas for subdiffraction-limited plasmon-enhanced microscopy under total internal reflection at angled light incidence. Different shapes of near-field hot spots were calculated by varying geometrical parameters of nanoantenna structures. An inverse relationship between full-width-at-half- maximum (FWHM) and ellipticity of a hot spot was found. Among the three patterns considered, square nanoantenna patterns provided the smallest FWHM ellipticity product with a spot size of approximately 53 $\times$ 110 nm$2$ due to efficient plasmon localization. The size of a nanopattern affects FWHM significantly by producing a smaller hot spot if the size decreases. The effects of other parameters are also discussed.
| Original language | English |
|---|---|
| Article number | 6165327 |
| Pages (from-to) | 1684-1691 |
| Number of pages | 8 |
| Journal | IEEE Journal on Selected Topics in Quantum Electronics |
| Volume | 18 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2012 Sep 5 |
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All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering
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Electromagnetic near-field nanoantennas for subdiffraction-limited surface plasmon-enhanced light microscopy. / Lee, Wonju; Kim, Kyujung; Kim, Donghyun.
In: IEEE Journal on Selected Topics in Quantum Electronics, Vol. 18, No. 6, 6165327, 05.09.2012, p. 1684-1691.Research output: Contribution to journal › Article
TY - JOUR
T1 - Electromagnetic near-field nanoantennas for subdiffraction-limited surface plasmon-enhanced light microscopy
AU - Lee, Wonju
AU - Kim, Kyujung
AU - Kim, Donghyun
PY - 2012/9/5
Y1 - 2012/9/5
N2 - We investigate electromagnetically amplified local fields or hot spots created by surface nanoantennas for subdiffraction-limited plasmon-enhanced microscopy under total internal reflection at angled light incidence. Different shapes of near-field hot spots were calculated by varying geometrical parameters of nanoantenna structures. An inverse relationship between full-width-at-half- maximum (FWHM) and ellipticity of a hot spot was found. Among the three patterns considered, square nanoantenna patterns provided the smallest FWHM ellipticity product with a spot size of approximately 53 $\times$ 110 nm$2$ due to efficient plasmon localization. The size of a nanopattern affects FWHM significantly by producing a smaller hot spot if the size decreases. The effects of other parameters are also discussed.
AB - We investigate electromagnetically amplified local fields or hot spots created by surface nanoantennas for subdiffraction-limited plasmon-enhanced microscopy under total internal reflection at angled light incidence. Different shapes of near-field hot spots were calculated by varying geometrical parameters of nanoantenna structures. An inverse relationship between full-width-at-half- maximum (FWHM) and ellipticity of a hot spot was found. Among the three patterns considered, square nanoantenna patterns provided the smallest FWHM ellipticity product with a spot size of approximately 53 $\times$ 110 nm$2$ due to efficient plasmon localization. The size of a nanopattern affects FWHM significantly by producing a smaller hot spot if the size decreases. The effects of other parameters are also discussed.
UR - http://www.scopus.com/inward/record.url?scp=84866249552&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84866249552&partnerID=8YFLogxK
U2 - 10.1109/JSTQE.2012.2190046
DO - 10.1109/JSTQE.2012.2190046
M3 - Article
AN - SCOPUS:84866249552
VL - 18
SP - 1684
EP - 1691
JO - IEEE Journal on Selected Topics in Quantum Electronics
JF - IEEE Journal on Selected Topics in Quantum Electronics
SN - 1077-260X
IS - 6
M1 - 6165327
ER -