Abstract
We investigate electromagnetically amplified local fields or hot spots created by surface nanoantennas for subdiffraction-limited plasmon-enhanced microscopy under total internal reflection at angled light incidence. Different shapes of near-field hot spots were calculated by varying geometrical parameters of nanoantenna structures. An inverse relationship between full-width-at-half- maximum (FWHM) and ellipticity of a hot spot was found. Among the three patterns considered, square nanoantenna patterns provided the smallest FWHM ellipticity product with a spot size of approximately 53 $\times$ 110 nm$2$ due to efficient plasmon localization. The size of a nanopattern affects FWHM significantly by producing a smaller hot spot if the size decreases. The effects of other parameters are also discussed.
| Original language | English |
|---|---|
| Article number | 6165327 |
| Pages (from-to) | 1684-1691 |
| Number of pages | 8 |
| Journal | IEEE Journal on Selected Topics in Quantum Electronics |
| Volume | 18 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2012 |
Bibliographical note
Funding Information:Manuscript received December 19, 2011; revised February 6, 2012; accepted February 26, 2012. This work was supported by the National Research Foundation (NRF) under Grants NRF-331-2008-1-D00389, NRF-2010-0007993, and NRF-2011-0017500, funded by the Korean Government. The authors are with the School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Korea (e-mail: kimd@yonsei.ac.kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/JSTQE.2012.2190046
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering