Electromagnetic near-field nanoantennas for subdiffraction-limited surface plasmon-enhanced light microscopy

Wonju Lee, Kyujung Kim, Donghyun Kim

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

We investigate electromagnetically amplified local fields or hot spots created by surface nanoantennas for subdiffraction-limited plasmon-enhanced microscopy under total internal reflection at angled light incidence. Different shapes of near-field hot spots were calculated by varying geometrical parameters of nanoantenna structures. An inverse relationship between full-width-at-half- maximum (FWHM) and ellipticity of a hot spot was found. Among the three patterns considered, square nanoantenna patterns provided the smallest FWHM ellipticity product with a spot size of approximately 53 $\times$ 110 nm$2$ due to efficient plasmon localization. The size of a nanopattern affects FWHM significantly by producing a smaller hot spot if the size decreases. The effects of other parameters are also discussed.

Original languageEnglish
Article number6165327
Pages (from-to)1684-1691
Number of pages8
JournalIEEE Journal on Selected Topics in Quantum Electronics
Volume18
Issue number6
DOIs
Publication statusPublished - 2012 Sep 5

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Full width at half maximum
Optical microscopy
near fields
ellipticity
electromagnetism
microscopy
Microscopic examination
incidence
products
Nanoantennas

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

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Electromagnetic near-field nanoantennas for subdiffraction-limited surface plasmon-enhanced light microscopy. / Lee, Wonju; Kim, Kyujung; Kim, Donghyun.

In: IEEE Journal on Selected Topics in Quantum Electronics, Vol. 18, No. 6, 6165327, 05.09.2012, p. 1684-1691.

Research output: Contribution to journalArticle

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