Electromechanical stability of buckled thin metal films on elastomer

Donyoung Kim, Hyun Sik Hwang, Dahl-Young Khang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Oxidizable metals such as Al are found to become highly resistive when exposed to air in buckled state, > 10× resistance increase compared to that in flat configuration. On the other hand, noble metal and oxide conductor films, such as Au and indium tin oxide show negligible resistance increase. The enhanced oxidation of grain boundaries that are exposed to air when buckled is found to be responsible for the observed electromechanical stability. Simple yet effective method, i.e., thin capping layer of noble metal, to prevent the oxidation of non-noble metal is proposed and experimentally verified.

Original languageEnglish
Pages (from-to)5511-5515
Number of pages5
JournalThin Solid Films
Volume519
Issue number16
DOIs
Publication statusPublished - 2011 Jun 1

Fingerprint

Elastomers
elastomers
Precious metals
noble metals
metal films
Metals
Oxidation
oxidation
air
Air
Tin oxides
indium oxides
metals
Indium
Oxides
tin oxides
Grain boundaries
grain boundaries
conductors
oxides

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Kim, Donyoung ; Hwang, Hyun Sik ; Khang, Dahl-Young. / Electromechanical stability of buckled thin metal films on elastomer. In: Thin Solid Films. 2011 ; Vol. 519, No. 16. pp. 5511-5515.
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Electromechanical stability of buckled thin metal films on elastomer. / Kim, Donyoung; Hwang, Hyun Sik; Khang, Dahl-Young.

In: Thin Solid Films, Vol. 519, No. 16, 01.06.2011, p. 5511-5515.

Research output: Contribution to journalArticle

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