Electron and hole stability in GaN and ZnO

Aron Walsh, C. Richard A. Catlow, Martina Miskufova, Alexey A. Sokol

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

We assess the thermodynamic doping limits of GaN and ZnO on the basis of point defect calculations performed using the embedded cluster approach and employing a hybrid non-local density functional for the quantum mechanical region. Within this approach we have calculated a staggered (type-II) valence band alignment between the two materials, with the N2p states contributing to the lower ionization potential of GaN. With respect to the stability of free electron and hole carriers, redox reactions resulting in charge compensation by ionic defects are found to be largely endothermic (unfavourable) for electrons and exothermic (favourable) for holes, which is consistent with the efficacy of electron conduction in these materials. Approaches for overcoming these fundamental thermodynamic limits are discussed.

Original languageEnglish
Article number334217
JournalJournal of Physics Condensed Matter
Volume23
Issue number33
DOIs
Publication statusPublished - 2011 Aug 24

Fingerprint

Electrons
Thermodynamics
thermodynamics
ionization potentials
conduction electrons
point defects
free electrons
electrons
Ionization potential
Redox reactions
alignment
Point defects
Valence bands
valence
Oxidation-Reduction
defects
Doping (additives)
Defects
Compensation and Redress

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Walsh, Aron ; Catlow, C. Richard A. ; Miskufova, Martina ; Sokol, Alexey A. / Electron and hole stability in GaN and ZnO. In: Journal of Physics Condensed Matter. 2011 ; Vol. 23, No. 33.
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Electron and hole stability in GaN and ZnO. / Walsh, Aron; Catlow, C. Richard A.; Miskufova, Martina; Sokol, Alexey A.

In: Journal of Physics Condensed Matter, Vol. 23, No. 33, 334217, 24.08.2011.

Research output: Contribution to journalArticle

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AU - Walsh, Aron

AU - Catlow, C. Richard A.

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