Electron hopping rate measurements in ITO junctions

Charge diffusion in a layer-by-layer deposited ruthenium(II)-bis(benzimidazolyl)pyridine-phosphonate- TiO2 film

Charles Y. Cummings, Jay D. Wadhawan, Takuya Nakabayashi, Masa Aki Haga, Liza Rassaei, Sara E.C. Dale, Simon Bending, Martin Pumera, Stephen C. Parker, Frank Marken

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Focused ion beam (FIB) machining allowed a sub-micron trench to be cut through tin-doped indium oxide (ITO) film on glass to give a generator - collector junction electrode with narrow gap (ca. 600 nm). A layer-by-layer deposited film composed of a dinuclear ruthenium(II)-bis(benzimidazolyl) pyridine-phosphonate (as the negative component) and nanoparticulate TiO 2 (ca. 6 nm diameter, as the positive component) was formed and investigated first on simple ITO electrodes and then on ITO junction electrodes. The charge transport within this film due to Ru(II/III) redox switching (electron hopping) was investigated and an apparent diffusion coefficient of ca. Dapp = 2 (± 1) × 10-15 m2 s -1 was observed with minimal contributions from intra-molecular Ru-Ru interactions. The benefits of FIB-cut ITO junctions as a tool in determining charge hopping rates are highlighted.

Original languageEnglish
Pages (from-to)196-201
Number of pages6
JournalJournal of Electroanalytical Chemistry
Volume657
Issue number1-2
DOIs
Publication statusPublished - 2011 Jul 1

Fingerprint

Organophosphonates
Ruthenium
Pyridine
Focused ion beams
Electrodes
Electrons
Tin
Indium
Charge transfer
Machining
Glass
Oxides
pyridine

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry
  • Chemical Engineering(all)
  • Electrochemistry

Cite this

Cummings, Charles Y. ; Wadhawan, Jay D. ; Nakabayashi, Takuya ; Haga, Masa Aki ; Rassaei, Liza ; Dale, Sara E.C. ; Bending, Simon ; Pumera, Martin ; Parker, Stephen C. ; Marken, Frank. / Electron hopping rate measurements in ITO junctions : Charge diffusion in a layer-by-layer deposited ruthenium(II)-bis(benzimidazolyl)pyridine-phosphonate- TiO2 film. In: Journal of Electroanalytical Chemistry. 2011 ; Vol. 657, No. 1-2. pp. 196-201.
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Electron hopping rate measurements in ITO junctions : Charge diffusion in a layer-by-layer deposited ruthenium(II)-bis(benzimidazolyl)pyridine-phosphonate- TiO2 film. / Cummings, Charles Y.; Wadhawan, Jay D.; Nakabayashi, Takuya; Haga, Masa Aki; Rassaei, Liza; Dale, Sara E.C.; Bending, Simon; Pumera, Martin; Parker, Stephen C.; Marken, Frank.

In: Journal of Electroanalytical Chemistry, Vol. 657, No. 1-2, 01.07.2011, p. 196-201.

Research output: Contribution to journalArticle

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AU - Cummings, Charles Y.

AU - Wadhawan, Jay D.

AU - Nakabayashi, Takuya

AU - Haga, Masa Aki

AU - Rassaei, Liza

AU - Dale, Sara E.C.

AU - Bending, Simon

AU - Pumera, Martin

AU - Parker, Stephen C.

AU - Marken, Frank

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