Electron hopping rate measurements in ITO junctions: Charge diffusion in a layer-by-layer deposited ruthenium(II)-bis(benzimidazolyl)pyridine-phosphonate- TiO2 film

Charles Y. Cummings, Jay D. Wadhawan, Takuya Nakabayashi, Masa Aki Haga, Liza Rassaei, Sara E.C. Dale, Simon Bending, Martin Pumera, Stephen C. Parker, Frank Marken

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Chemical Compounds

Engineering & Materials Science