Electronic structure of C60/zinc phthalocyanine/V2o5 interfaces studied using photoemission spectroscopy for organic photovoltaic applications

Chang Jin Lim, Min Gyu Park, Min Su Kim, Jeong Hwa Han, Soohaeng Cho, Mann-Ho Cho, Yeonjin Yi, Hyunbok Lee, Sangwan Cho

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The interfacial electronic structures of a bilayer of fullerene (C60) and zinc phthalocyanine (ZnPc) grown on vanadium pentoxide (V2O5) thin films deposited using radio frequency sputtering under various conditions were studied using X-ray and ultraviolet photoelectron spectroscopy. The energy difference between the highest occupied molecular orbital (HOMO) level of the ZnPc layer and the lowest unoccupied molecular orbital (LUMO) level of the C60 layer was determined and compared with that grown on an indium tin oxide (ITO) substrate. The energy difference of a heterojunction on all V2O5 was found to be 1.3~1.4 eV, while that on ITO was 1.1 eV. This difference could be due to the higher binding energy of the HOMO of ZnPc on V2O5 than that on ITO regardless of work functions of the substrates. We also determined the complete energy level diagrams of C60/ZnPc on V2O5 and ITO.

Original languageEnglish
Article number449
JournalMolecules
Volume23
Issue number2
DOIs
Publication statusPublished - 2018 Jan 1

Fingerprint

Photoelectron Spectroscopy
Photoelectron spectroscopy
indium oxides
tin oxides
Electronic structure
photoelectric emission
zinc
electronic structure
Molecular orbitals
molecular orbitals
spectroscopy
Ultraviolet photoelectron spectroscopy
ultraviolet spectroscopy
vanadium
fullerenes
heterojunctions
Substrates
radio frequencies
Binding energy
Radio

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry
  • Chemistry (miscellaneous)
  • Molecular Medicine
  • Pharmaceutical Science
  • Drug Discovery
  • Physical and Theoretical Chemistry
  • Organic Chemistry

Cite this

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title = "Electronic structure of C60/zinc phthalocyanine/V2o5 interfaces studied using photoemission spectroscopy for organic photovoltaic applications",
abstract = "The interfacial electronic structures of a bilayer of fullerene (C60) and zinc phthalocyanine (ZnPc) grown on vanadium pentoxide (V2O5) thin films deposited using radio frequency sputtering under various conditions were studied using X-ray and ultraviolet photoelectron spectroscopy. The energy difference between the highest occupied molecular orbital (HOMO) level of the ZnPc layer and the lowest unoccupied molecular orbital (LUMO) level of the C60 layer was determined and compared with that grown on an indium tin oxide (ITO) substrate. The energy difference of a heterojunction on all V2O5 was found to be 1.3~1.4 eV, while that on ITO was 1.1 eV. This difference could be due to the higher binding energy of the HOMO of ZnPc on V2O5 than that on ITO regardless of work functions of the substrates. We also determined the complete energy level diagrams of C60/ZnPc on V2O5 and ITO.",
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Electronic structure of C60/zinc phthalocyanine/V2o5 interfaces studied using photoemission spectroscopy for organic photovoltaic applications. / Lim, Chang Jin; Park, Min Gyu; Kim, Min Su; Han, Jeong Hwa; Cho, Soohaeng; Cho, Mann-Ho; Yi, Yeonjin; Lee, Hyunbok; Cho, Sangwan.

In: Molecules, Vol. 23, No. 2, 449, 01.01.2018.

Research output: Contribution to journalArticle

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AU - Lim, Chang Jin

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AU - Kim, Min Su

AU - Han, Jeong Hwa

AU - Cho, Soohaeng

AU - Cho, Mann-Ho

AU - Yi, Yeonjin

AU - Lee, Hyunbok

AU - Cho, Sangwan

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