Electronic structure of electron-doped Sm1.86 Ce0.14 Cu O4: Strong pseudogap effects, nodeless gap, and signatures of short-range order

S. R. Park, Y. S. Roh, Y. K. Yoon, C. S. Leem, J. H. Kim, B. J. Kim, H. Koh, H. Eisaki, N. P. Armitage, C. Kim

Research output: Contribution to journalArticlepeer-review

64 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Electronic structure of electron-doped Sm1.86 Ce0.14 Cu O4: Strong pseudogap effects, nodeless gap, and signatures of short-range order'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy