The electronic structure of ion beam mixed Co/Pt multilayered films was investigated using synchrotron-based soft X-ray fluorescence (SXF) and photoemission spectroscopy (PES). Co/Pt multilayered films (eight periods of Co and Pt sublayers) were prepared on Si(100) substrates by alternating electron-beam evaporation followed by ion beam mixing with 80 keV Ar ions under high vacuum. The SXF and PES measurements show that ion beam mixing can change the spectral features of Co 3d valence bands for PES spectra and the emission energies for Co L3 SXF spectra. The similar valence-band characteristics of IBM CoPt3 with pure Co and the low emission energy with respect to stable CoPt3 alloy are correlated with the isolated Co 3d states with a weakened interatomic interaction due to the reduced coordination.
|Number of pages||5|
|Journal||Journal of Electron Spectroscopy and Related Phenomena|
|Publication status||Published - 2001 Mar|
|Event||8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA|
Duration: 2000 Aug 8 → 2000 Aug 12
Bibliographical noteFunding Information:
This work was supported by the Brain Korea 21 Project and the Korea Science and Engineering Foundation through Grant No. 995-0200-003-2.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Physical and Theoretical Chemistry