Electronic structure of ion beam mixed ferromagnetic multilayered films

G. S. Chang, S. H. Kim, K. H. Chae, E. Z. Kurmaev, V. Galakhov, A. Moewes, Y. P. Lee, K. Jeong, C. N. Whang

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Abstract

The electronic structure of ion beam mixed Co/Pt multilayered films was investigated using synchrotron-based soft X-ray fluorescence (SXF) and photoemission spectroscopy (PES). Co/Pt multilayered films (eight periods of Co and Pt sublayers) were prepared on Si(100) substrates by alternating electron-beam evaporation followed by ion beam mixing with 80 keV Ar ions under high vacuum. The SXF and PES measurements show that ion beam mixing can change the spectral features of Co 3d valence bands for PES spectra and the emission energies for Co L3 SXF spectra. The similar valence-band characteristics of IBM CoPt3 with pure Co and the low emission energy with respect to stable CoPt3 alloy are correlated with the isolated Co 3d states with a weakened interatomic interaction due to the reduced coordination.

Original languageEnglish
Pages (from-to)807-811
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume114-116
DOIs
Publication statusPublished - 2001 Mar
Event8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA
Duration: 2000 Aug 82000 Aug 12

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

Cite this

Chang, G. S., Kim, S. H., Chae, K. H., Kurmaev, E. Z., Galakhov, V., Moewes, A., Lee, Y. P., Jeong, K., & Whang, C. N. (2001). Electronic structure of ion beam mixed ferromagnetic multilayered films. Journal of Electron Spectroscopy and Related Phenomena, 114-116, 807-811. https://doi.org/10.1016/S0368-2048(00)00271-1